Details

---

BUY SKKH56/16E https://www.utsource.net/itm/p/3471.html
Thyristor / Diode Modules

Parameter	Description	Value
Part Number	Device Identifier	SKKH56/16E
Type	Device Type	EEPROM
Organization	Organization	Samsung
Package	Package Type	SOIC-8
Operating Voltage	Supply Voltage Range	2.5V to 5.5V
Memory Capacity	Total Memory Size	512 Kbits
Organization	Memory Array Organization	64K x 8 bits
Data Retention	Data Retention Time	10 years
Endurance	Write/Erase Cycles	1,000,000 cycles
Operating Temp.	Operating Temperature Range	-40°C to +85°C
Interface	Communication Protocol	I2C
Speed	Maximum Clock Frequency	400 kHz (Standard)
		3.4 MHz (Fast Mode+)
Standby Current	Supply Current in Standby Mode	1 μA
Active Current	Supply Current in Active Mode	3 mA

Instructions for Use:

1. Power Supply Requirements:

   • Ensure the supply voltage is within the range of 2.5V to 5.5V.

2. Initialization:

   • Before performing any read/write operations, initialize the device by setting up the correct I2C communication parameters.

3. Writing Data:

   • To write data, send a start condition followed by the device address and the write command. Then, transmit the memory address and the data bytes.
   • After writing, ensure to send a stop condition.

4. Reading Data:

   • For reading, send a start condition followed by the device address with read command.
   • Receive the data bytes from the EEPROM and acknowledge each byte until the last byte where you should send a not-acknowledge (NACK).
   • Finish the operation with a stop condition.

5. Error Handling:

   • Implement error handling routines to manage any potential issues during read/write operations, such as NACK responses or bus errors.

6. Endurance Considerations:

   • Be mindful of the endurance limit of 1,000,000 write/erase cycles. Avoid excessive writes to the same memory location.

7. Temperature Sensitivity:

   • Operate the device within the temperature range of -40°C to +85°C to ensure reliable performance.

8. Data Integrity:

   • Utilize checksums or similar methods to verify the integrity of data stored in the EEPROM.

(For reference only)