EP1K30TC144-2N
Specifications
SKU
421072
Details
BUY EP1K30TC144-2N https://www.utsource.net/itm/p/421072.html
IC ACEX 1K FPGA 30K 144-TQFP
| Parameter | Description | Value |
|---|---|---|
| Device Type | FPGA | - |
| Family | Cyclone I | - |
| Density | Logic Cells | 3,000 |
| I/O Pins | - | 144 |
| Package | - | TQFP-144 |
| Speed Grade | - | -2 (ns) |
| Configuration Memory | - | 512 Kbits |
| Configuration Method | - | Active Serial, Passive Serial, JTAG |
| Supply Voltage Vcc | Core | 1.5V ± 0.15V |
| Supply Voltage Vcc | I/O | 3.3V ± 0.33V or 2.5V ± 0.25V |
| Operating Temperature Range | Industrial | -40°C to +85°C |
| Commercial | 0°C to +70°C | |
| Storage Temperature Range | - | -65°C to +150°C |
| Maximum Junction Temperature | - | +125°C |
| Static Power Consumption | - | < 1 mW (typical) |
| Dynamic Power Consumption | - | < 1 W (typical) |
Instructions for EP1K30TC144-2N:
Power Supply:
- Ensure that the core voltage (Vcc) is set to 1.5V ± 0.15V.
- The I/O voltage (Vcc) can be set to either 3.3V ± 0.33V or 2.5V ± 0.25V, depending on your application requirements.
Configuration:
- Use one of the supported configuration methods: Active Serial, Passive Serial, or JTAG.
- Ensure the configuration memory is properly loaded with the correct bitstream before powering on the device.
Temperature Considerations:
- Operate the device within the specified temperature range for industrial (-40°C to +85°C) or commercial (0°C to +70°C) applications.
- Store the device within the storage temperature range of -65°C to +150°C.
- Monitor the junction temperature to ensure it does not exceed +125°C.
Power Consumption:
- The static power consumption is typically less than 1 mW.
- The dynamic power consumption is typically less than 1 W.
Handling:
- Handle the device with care to avoid damage from electrostatic discharge (ESD).
- Follow proper soldering and rework procedures to prevent thermal damage.
Testing:
- Perform functional tests to verify the correct operation of the device after configuration and power-up.
- Use boundary-scan testing (JTAG) for diagnostic purposes.
Documentation:
- Refer to the datasheet and user manual for detailed information on pinout, timing diagrams, and other technical specifications.
View more about EP1K30TC144-2N on main site
