25LC256T-I/SN

25LC256T-I/SN

Category: IC ChipsMemory

Specifications
SKU
844385
Details

BUY 25LC256T-I/SN https://www.utsource.net/itm/p/844385.html
256K, 32K X 8, SER EE, -40C to +85C, 8-SOIC 150mil, T/R
Parameter Symbol Conditions Min Typ Max Unit
Supply Voltage VCC Operating 2.0 - 5.5 V
Standby Current ICC(STANDBY) VCC = 5.5V - 1.0 - μA
Active Current ICC(ACTIVE) VCC = 5.5V, f = 10 MHz 1.0 3.0 - mA
Data Retention Time - - - 100 - years
Write Cycle Time tWC - - 5.0 - ms
Page Write Size - - - 32 - bytes
Serial Clock Frequency fSCL Operating - 10.0 - MHz
Storage Temperature TSTORAGE - -40 - 85 °C
Operating Temperature TOP - -40 - 85 °C

Instructions for Use:

  1. Power Supply:

    • Ensure the supply voltage (VCC) is within the range of 2.0V to 5.5V.
    • The device has low standby current (ICC(STANDBY)) of 1.0 μA at 5.5V.
  2. Data Retention:

    • The data retention time is 100 years under normal operating conditions.
  3. Write Operations:

    • The write cycle time (tWC) is 5.0 ms.
    • Each page write operation can handle up to 32 bytes.
  4. Clock Frequency:

    • The maximum serial clock frequency (fSCL) is 10.0 MHz.
  5. Temperature Ranges:

    • The storage temperature range is from -40°C to 85°C.
    • The operating temperature range is also from -40°C to 85°C.
  6. Handling and Storage:

    • Store the device in a dry, cool place to ensure long-term reliability.
    • Avoid exposing the device to extreme temperatures or humidity.
  7. Pin Configuration:

    • Refer to the datasheet for the specific pin configuration and connections.
  8. Programming:

    • Use standard SPI (Serial Peripheral Interface) commands for read, write, and other operations.
    • Ensure the correct sequence of commands to avoid data corruption.
  9. Protective Measures:

    • Use appropriate decoupling capacitors near the power supply pins to filter out noise.
    • Implement ESD (Electrostatic Discharge) protection measures to prevent damage during handling.
  10. Testing:

    • Before integrating the device into a system, perform initial testing to verify functionality and performance.
(For reference only)

View more about 25LC256T-I/SN on main site