Details

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BUY AT49BV162AT-70TI https://www.utsource.net/itm/p/1116528.html
16-megabit 1M x 16/2M x 8 3-volt Only Flash Memory

Parameter	Symbol	Conditions	Min	Typ	Max	Unit
Supply Voltage	VCC	Operating	2.7	-	3.6	V
Standby Current	ICC	VCC = 3.0V	1	5	10	μA
Active Current	ICC	VCC = 3.0V, Reading	5	15	30	mA
Access Time	tACC	VCC = 3.0V	70	-	-	ns
Write Cycle Time	tWC	VCC = 3.0V	70	-	-	ns
Block Erase Time	tBE	VCC = 3.0V	200	-	800	ms
Chip Erase Time	tCE	VCC = 3.0V	2000	-	8000	ms
Data Retention	-	-	10	-	-	years
Operating Temperature Range	-	-	-40	-	85	°C
Storage Temperature Range	-	-	-65	-	150	°C

Instructions for Use

1. Power Supply:

   • Ensure the supply voltage (VCC) is within the specified range of 2.7V to 3.6V.

2. Current Consumption:

   • Monitor the standby current (ICC) which should not exceed 10μA at 3.0V.
   • The active current during reading operations should be between 5mA and 30mA at 3.0V.

3. Timing Parameters:

   • Ensure the access time (tACC) is at least 70ns when operating at 3.0V.
   • The write cycle time (tWC) must also be at least 70ns at 3.0V.
   • For block erase operations, the time (tBE) can range from 200ms to 800ms at 3.0V.
   • Chip erase operations require a time (tCE) between 2000ms and 8000ms at 3.0V.

4. Data Retention:

   • The device is designed to retain data for up to 10 years under normal operating conditions.

5. Temperature Ranges:

   • The operating temperature range is from -40°C to 85°C.
   • The storage temperature range is from -65°C to 150°C.

6. Handling and Storage:

   • Store the device in a dry, cool place to ensure long-term reliability.
   • Handle with care to avoid static discharge, which can damage the device.

7. Programming and Erasing:

   • Follow the specific programming and erasing procedures outlined in the datasheet to ensure reliable operation.
   • Use appropriate programming algorithms to manage write and erase cycles effectively.

8. Pin Configuration:

   • Refer to the pin configuration diagram in the datasheet to correctly connect the device to your circuit.

9. Testing:

   • Perform initial testing to verify that the device meets the specified parameters before integrating it into your design.

(For reference only)