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IC FLASH 16MBIT PARALLEL 48TSOP
Parameter | Description | Value |
---|---|---|
Device Type | Non-Volatile Flash Memory | - |
Density | Memory Density | 16 Mbit (2 M x 8) |
Package | Package Type | TSSOP-48 |
Operating Voltage (Vcc) | Supply Voltage Range | 2.7V to 3.6V |
Access Time (tACC) | Access Time | 70 ns |
Data Retention | Data Retention Time | 10 years |
Programming Cycle Time | Programming Cycle Time | 2 ms (Typical) |
Erase Cycle Time | Block Erase Time | 1 s (Typical) |
Endurance | Program/Erase Cycles | 100,000 cycles |
Operating Temperature (Toper) | Operating Temperature Range | -40°C to +85°C |
Storage Temperature (Tstg) | Storage Temperature Range | -65°C to +150°C |
Standby Current (ISB) | Standby Current | 1 μA (Max) |
Active Current (IAB) | Active Current | 20 mA (Max) |
Write Protect | Write Protect Pin | WP# |
Hold Function | Hold Function Pin | HOLD# |
Command Set | Command Set Compatibility | JEDEC JESD68 Standard |
Pin Configuration | Pin Count | 48 pins |
Instructions for Use:
Power Supply:
- Connect Vcc to the supply voltage (2.7V to 3.6V).
- Connect Vss to ground.
Address Lines:
- Connect A0-A19 to the address lines to select the memory location.
Data Lines:
- Connect D0-D7 to the data lines for reading and writing data.
Control Signals:
- OE# (Output Enable): Low to enable read operations.
- WE# (Write Enable): Low to initiate write operations.
- CE# (Chip Enable): Low to select the device.
- WP# (Write Protect): High to allow writes; low to prevent writes.
- HOLD# (Hold): High to allow normal operation; low to pause the device.
Programming and Erasing:
- Block Erase: Apply the appropriate command sequence to erase a block of memory.
- Page Program: Write data to a page by applying the program command and data.
Timing Considerations:
- Ensure that all timing parameters (e.g., access time, programming cycle time, erase cycle time) are met to avoid data corruption.
Handling Precautions:
- Handle the device with care to avoid static discharge.
- Store the device in a dry environment to prevent moisture damage.
Testing and Validation:
- Perform thorough testing to ensure the device is functioning correctly before deployment.
For detailed command sequences and advanced features, refer to the datasheet provided by the manufacturer.
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