FAN7314

FAN7314

Category: IC ChipsDriver Ics

Specifications
SKU
1582354
Details

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LCD Backlight Inverter Drive IC
Parameter Symbol Test Conditions Min Typ Max Unit
Supply Voltage VCC - 4.5 - 20 V
Operating Temperature TOP - -40 - 150 °C
Storage Temperature TSTG - -65 - 150 °C
Gate Drive Current (High) IGSS(H) VGS = 15V - 4 - A
Gate Drive Current (Low) IGSS(L) VGS = -6V - -1 - A
Propagation Delay Time td VCC = 15V, RL = 1Ω - 80 - ns
Pulse Width Distortion tpd VCC = 15V, RL = 1Ω - 10 - ns
Maximum Output Current IOUT VCC = 15V - 4 - A
Maximum Input Current IIN VCC = 15V - 100 - μA

Instructions for Using FAN7314

  1. Power Supply:

    • Ensure the supply voltage (VCC) is within the range of 4.5V to 20V.
    • Use a stable power source to avoid fluctuations that could affect performance.
  2. Temperature Considerations:

    • Operate the device within the temperature range of -40°C to 150°C.
    • Store the device in an environment between -65°C and 150°C.
  3. Gate Drive Current:

    • For high-side gate drive, ensure the current does not exceed 4A when VGS is 15V.
    • For low-side gate drive, ensure the current does not exceed -1A when VGS is -6V.
  4. Propagation Delay and Pulse Width Distortion:

    • The propagation delay time (td) should be around 80ns under typical conditions.
    • The pulse width distortion (tpd) should be around 10ns under typical conditions.
  5. Output and Input Current:

    • The maximum output current (IOUT) is 4A at VCC = 15V.
    • The maximum input current (IIN) is 100μA at VCC = 15V.
  6. PCB Layout:

    • Use short and wide traces for the gate drive signals to minimize inductance.
    • Place decoupling capacitors close to the power pins to reduce noise.
  7. Protection:

    • Implement appropriate overvoltage and overcurrent protection circuits to safeguard the device.
    • Use heat sinks if operating at high temperatures or under high load conditions.
  8. Testing:

    • Perform initial testing with a simple load to verify correct operation.
    • Gradually increase the complexity of the circuit while monitoring performance parameters.
(For reference only)

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