NAND04GW3B2DN6E

NAND04GW3B2DN6E

Category: IC ChipsMemory

Specifications
SKU
4923109
Details

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4 Gbit, 8 Gbit, 2112 byte/1056 word page multiplane architecture, 1.8 V or 3 V, NAND Flash memories
Parameter Description Value
Part Number Full part number NAND04GW3B2DN6E
Technology Type of memory technology NAND Flash
Density Storage capacity 4 Gb (512 MB)
Organization Memory organization 2048K x 16
Interface Data interface Toggle Mode 2.0
Voltage (Vcc) Operating voltage 1.8V ± 0.1V
Clock Frequency Maximum clock frequency 200 MHz
Data Rate Maximum data transfer rate 400 MT/s
Package Package type WSON-16 (5x6)
Operating Temperature Operating temperature range -40°C to +85°C
Storage Temperature Storage temperature range -55°C to +125°C
Endurance Program/Erase cycles 100,000 cycles
Retention Data retention at 25°C 10 years
Access Time Page read access time 35 μs
Write Time Page program time 700 μs
Erase Time Block erase time 1.5 ms
Input/Output (I/O) Number of I/O pins 8
Standby Current Standby current (typical) 50 μA
Active Current Active current (typical) 150 mA

Instructions for Use:

  1. Power Supply:

    • Ensure that the Vcc is within the specified range of 1.8V ± 0.1V.
    • Use a stable power supply to avoid voltage fluctuations.
  2. Clock Signal:

    • Provide a stable clock signal with a maximum frequency of 200 MHz.
    • Ensure that the clock signal is clean and free from noise to maintain data integrity.
  3. Data Transfer:

    • The device supports a maximum data transfer rate of 400 MT/s using the Toggle Mode 2.0 interface.
    • Use appropriate timing and control signals to manage data read and write operations.
  4. Temperature Range:

    • Operate the device within the specified temperature range of -40°C to +85°C.
    • Store the device within the storage temperature range of -55°C to +125°C to ensure long-term reliability.
  5. Endurance and Retention:

    • The device is rated for up to 100,000 program/erase cycles.
    • Data retention is guaranteed for 10 years at 25°C.
  6. Pin Configuration:

    • Refer to the pin configuration diagram in the datasheet for correct pin connections.
    • Ensure proper grounding and decoupling capacitors are used to minimize noise and improve stability.
  7. Initialization:

    • Follow the initialization sequence as outlined in the datasheet to configure the device correctly before use.
    • Use the appropriate command set to perform read, write, and erase operations.
  8. Error Handling:

    • Monitor status registers and error flags to detect and handle any errors during operation.
    • Implement error correction mechanisms if required to maintain data integrity.
  9. Programming:

    • Use the provided programming guidelines and command sequences to program and erase the memory.
    • Ensure that the device is properly configured before performing any write or erase operations.
  10. Documentation:

    • Always refer to the latest datasheet and application notes for detailed information and updates.
    • Contact the manufacturer for technical support and additional resources if needed.
(For reference only)

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