SN74HCT540N

SN74HCT540N


Specifications
SKU
5103954
Details

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OCTAL BUFFERS AND LINE DRIVERS WITH 3-STATE OUTPUTS
Parameter Symbol Min Typical Max Unit Notes
Supply Voltage VCC 2.0 - 6.0 V
Output High Level Voltage VOH - VCC - 0.25 VCC - 0.15 V IO = -400 μA
Output Low Level Voltage VOL 0.1 0.2 0.35 V IO = 4 mA
Input High Level Voltage VIH 2.0 - VCC V
Input Low Level Voltage VIL 0 - 0.8 V
Propagation Delay Time (Typ) tpd - 14 - ns VCC = 5V, TA = 25°C
Power Consumption ICC - 10 - μA VCC = 5V, No Load
Operating Temperature Range TA -40 - 85 °C
Storage Temperature Range TSTG -65 - 150 °C

Instructions for Use:

  1. Power Supply:

    • Ensure the supply voltage (VCC) is within the range of 2.0V to 6.0V.
    • Connect VCC to the positive power supply and GND to ground.
  2. Input Signals:

    • Apply input signals (VIH, VIL) that meet the specified voltage levels.
    • Avoid floating inputs; use pull-up or pull-down resistors if necessary.
  3. Output Signals:

    • The output high level (VOH) should be close to VCC when the output is high.
    • The output low level (VOL) should be close to 0V when the output is low.
    • Ensure the load current does not exceed the maximum ratings.
  4. Propagation Delay:

    • The typical propagation delay time (tpd) is 14 ns at VCC = 5V and TA = 25°C.
    • Adjust timing considerations accordingly for different operating conditions.
  5. Temperature:

    • Operate the device within the temperature range of -40°C to 85°C.
    • Store the device within the storage temperature range of -65°C to 150°C.
  6. Power Consumption:

    • The typical power consumption (ICC) is 10 μA at VCC = 5V with no load.
    • Consider power consumption in low-power applications.
  7. Handling:

    • Handle the device with care to avoid static damage.
    • Follow proper ESD (Electrostatic Discharge) precautions during handling and assembly.
  8. Mounting:

    • Ensure proper mounting on the PCB to maintain good thermal performance.
    • Follow recommended soldering profiles and reflow temperatures.
  9. Testing:

    • Verify the functionality of the device using test vectors and known good signals.
    • Monitor power supply and signal integrity during testing.
(For reference only)

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