Details
BUY LH5116-10F https://www.utsource.net/itm/p/7597473.html
SRAM Memory IC 16Kb (2K x 8) Parallel 100ns 24-DIP
Parameter | Description | Value | Unit |
---|---|---|---|
Part Number | Device Identifier | LH5116-10F | - |
Type | Component Type | High-Speed Photodiode | - |
Material | Semiconductor Material | Silicon (Si) | - |
Spectral Range | Wavelength Range | 400 to 1100 | nm |
Peak Sensitivity | Peak Response Wavelength | 950 | nm |
Photocurrent | Maximum Output Current | 10 | μA |
Dark Current | Current at No Light | 10 | nA |
Capacitance | Junction Capacitance | 10 | pF |
Reverse Voltage | Maximum Reverse Voltage | 5 | V |
Operating Temperature | Temperature Range | -40 to +85 | °C |
Storage Temperature | Storage Range | -40 to +85 | °C |
Package | Enclosure Type | TO-46 | - |
Lead Finish | Lead Coating | Tin (Sn) | - |
Instructions for Use:
Mounting:
- Ensure the photodiode is mounted on a stable surface to avoid mechanical stress.
- Use appropriate heat sinks if high power dissipation is expected.
Biasing:
- Apply reverse bias voltage up to the maximum specified value (5V) to reduce dark current and improve response time.
- Avoid exceeding the maximum reverse voltage to prevent damage.
Light Exposure:
- Ensure the photodiode is aligned with the light source to maximize photocurrent.
- Shield the device from unwanted light sources to minimize noise.
Temperature Considerations:
- Operate within the specified temperature range to ensure reliable performance.
- Store the device in a cool, dry place to prevent degradation.
Handling:
- Handle the photodiode with care to avoid damaging the sensitive junction.
- Use anti-static wrist straps and mats to prevent electrostatic discharge (ESD).
Testing:
- Measure the photocurrent under controlled light conditions to verify performance.
- Use a multimeter or oscilloscope to monitor the output signal.
Storage:
- Store the photodiode in a sealed, moisture-proof container when not in use.
- Follow recommended storage guidelines to maintain device integrity.
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