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SRAM - Asynchronous Memory IC 64Kb (8K x 8) Parallel 70ns 28-PDIP
Parameter | Description | Value |
---|---|---|
Device Type | Type of Memory | 64K x 8 CMOS Static RAM |
Supply Voltage (VCC) | Operating Supply Voltage | 5.0V ± 0.5V |
Operating Temperature Range (TA) | Ambient Operating Temperature | -40°C to +85°C |
Access Time (tAC) | Access Time at VCC = 5.0V, TA = 25°C | 70ns max |
Cycle Time (tCYC) | Cycle Time at VCC = 5.0V, TA = 25°C | 70ns max |
Output Enable Time (tOE) | Output Enable Time at VCC = 5.0V, TA = 25°C | 15ns max |
Write Enable Time (tWE) | Write Enable Time at VCC = 5.0V, TA = 25°C | 15ns max |
Data Hold Time (tDH) | Data Hold Time at VCC = 5.0V, TA = 25°C | 5ns min |
Address Setup Time (tAS) | Address Setup Time at VCC = 5.0V, TA = 25°C | 20ns max |
Data Setup Time (tDS) | Data Setup Time at VCC = 5.0V, TA = 25°C | 20ns max |
Power Consumption (ICC) | Active Current at VCC = 5.0V, TA = 25°C | 20mA max |
Standby Current (ISB) | Standby Current at VCC = 5.0V, TA = 25°C | 10μA max |
Package Type | Package Style | 28-Pin Plastic DIP (D) |
Pin Configuration | Number of Pins | 28 |
Storage Temperature Range (TSTG) | Storage Temperature | -65°C to +150°C |
Instructions for Use:
Power Supply:
- Ensure the supply voltage (VCC) is within the specified range of 4.5V to 5.5V.
- Connect VCC to the positive power supply and GND to the ground.
Address Lines:
- Connect the address lines (A0-A15) to the appropriate address bus.
- Ensure the address setup time (tAS) is met before the falling edge of the write enable (WE#) or output enable (OE#) signals.
Data Lines:
- Connect the data lines (D0-D7) to the data bus.
- Ensure the data setup time (tDS) and data hold time (tDH) are met during read and write operations.
Control Signals:
- Write Enable (WE#): Low to initiate a write operation. Ensure the write enable time (tWE) is met.
- Output Enable (OE#): Low to enable data output. Ensure the output enable time (tOE) is met.
- Chip Select (CS#): Low to select the device. The device is deselected when CS# is high.
Timing Considerations:
- Ensure all timing parameters (tAC, tCYC, tOE, tWE, tDS, tDH, tAS) are met to avoid data corruption or incorrect operation.
- Refer to the timing diagram in the datasheet for detailed timing relationships.
Handling:
- Handle the device with care to avoid static discharge.
- Store the device in a dry environment to prevent moisture damage.
Testing:
- Before integrating the device into a system, perform functional tests to ensure it meets the specified performance criteria.
Compliance:
- Ensure that the device complies with all relevant safety and regulatory standards for your application.
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