AS6C6264A-70PCN

AS6C6264A-70PCN

Category: IC Chips

Specifications
SKU
7605605
Details

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SRAM - Asynchronous Memory IC 64Kb (8K x 8) Parallel 70ns 28-PDIP
Parameter Description Value
Device Type Type of Memory 64K x 8 CMOS Static RAM
Supply Voltage (VCC) Operating Supply Voltage 5.0V ± 0.5V
Operating Temperature Range (TA) Ambient Operating Temperature -40°C to +85°C
Access Time (tAC) Access Time at VCC = 5.0V, TA = 25°C 70ns max
Cycle Time (tCYC) Cycle Time at VCC = 5.0V, TA = 25°C 70ns max
Output Enable Time (tOE) Output Enable Time at VCC = 5.0V, TA = 25°C 15ns max
Write Enable Time (tWE) Write Enable Time at VCC = 5.0V, TA = 25°C 15ns max
Data Hold Time (tDH) Data Hold Time at VCC = 5.0V, TA = 25°C 5ns min
Address Setup Time (tAS) Address Setup Time at VCC = 5.0V, TA = 25°C 20ns max
Data Setup Time (tDS) Data Setup Time at VCC = 5.0V, TA = 25°C 20ns max
Power Consumption (ICC) Active Current at VCC = 5.0V, TA = 25°C 20mA max
Standby Current (ISB) Standby Current at VCC = 5.0V, TA = 25°C 10μA max
Package Type Package Style 28-Pin Plastic DIP (D)
Pin Configuration Number of Pins 28
Storage Temperature Range (TSTG) Storage Temperature -65°C to +150°C

Instructions for Use:

  1. Power Supply:

    • Ensure the supply voltage (VCC) is within the specified range of 4.5V to 5.5V.
    • Connect VCC to the positive power supply and GND to the ground.
  2. Address Lines:

    • Connect the address lines (A0-A15) to the appropriate address bus.
    • Ensure the address setup time (tAS) is met before the falling edge of the write enable (WE#) or output enable (OE#) signals.
  3. Data Lines:

    • Connect the data lines (D0-D7) to the data bus.
    • Ensure the data setup time (tDS) and data hold time (tDH) are met during read and write operations.
  4. Control Signals:

    • Write Enable (WE#): Low to initiate a write operation. Ensure the write enable time (tWE) is met.
    • Output Enable (OE#): Low to enable data output. Ensure the output enable time (tOE) is met.
    • Chip Select (CS#): Low to select the device. The device is deselected when CS# is high.
  5. Timing Considerations:

    • Ensure all timing parameters (tAC, tCYC, tOE, tWE, tDS, tDH, tAS) are met to avoid data corruption or incorrect operation.
    • Refer to the timing diagram in the datasheet for detailed timing relationships.
  6. Handling:

    • Handle the device with care to avoid static discharge.
    • Store the device in a dry environment to prevent moisture damage.
  7. Testing:

    • Before integrating the device into a system, perform functional tests to ensure it meets the specified performance criteria.
  8. Compliance:

    • Ensure that the device complies with all relevant safety and regulatory standards for your application.
(For reference only)

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