Details
BUY JCS4N60FB https://www.utsource.net/itm/p/8847843.html
Parameter | Symbol | Min | Typ | Max | Unit | Description |
---|---|---|---|---|---|---|
Drain-Source Voltage | VDS | - | 600 | - | V | Maximum voltage between drain and source with gate open |
Gate-Source Voltage | VGS | -20 | - | 20 | V | Maximum voltage between gate and source |
Continuous Drain Current | ID | - | 4 | - | A | Maximum continuous drain current at TC = 25°C |
Pulse Drain Current | IDm | - | 12 | - | A | Maximum pulse drain current (tp ≤ 10 μs) |
Power Dissipation | PTOT | - | 120 | - | W | Maximum total power dissipation at TC = 25°C |
Junction Temperature | TJ | - | - | 175 | °C | Maximum junction temperature |
Storage Temperature | TSTG | -55 | - | 150 | °C | Operating temperature range for storage |
Thermal Resistance | RθJC | - | 1.5 | - | °C/W | Junction-to-case thermal resistance |
Instructions:
Handling Precautions:
- Handle the JCS4N60FB with care to avoid damage to the leads or the body.
- Use proper ESD (Electrostatic Discharge) protection when handling to prevent damage from static electricity.
Mounting:
- Ensure that the device is mounted on a heatsink if operating at high power levels to maintain the junction temperature within safe limits.
- Follow the recommended soldering profile to avoid thermal shock and ensure reliable connections.
Operating Conditions:
- Do not exceed the maximum ratings specified in the table to prevent damage to the device.
- Ensure that the gate-source voltage (VGS) is within the specified range to avoid gate oxide breakdown.
Testing:
- Use appropriate test equipment and methods to verify the performance of the device.
- Test the device under controlled conditions to ensure accurate results.
Storage:
- Store the device in a dry, cool place to prevent moisture damage.
- Keep the device in its original packaging until ready for use to protect against physical damage and contamination.
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