Details
BUY IKW30N60DTP https://www.utsource.net/itm/p/9462371.html
| Parameter | Symbol | Min | Typ | Max | Unit | Conditions |
|---|---|---|---|---|---|---|
| Collector-Emitter Voltage | VCE | - | 600 | - | V | - |
| Collector Current | IC | - | - | 30 | A | Tj = 25°C |
| Collector Current (Pulsed) | IC(rms) | - | - | 45 | A | Tj = 25°C, Pulse Width ≤ 10 μs, Duty Cycle ≤ 1% |
| Emitter-Base Voltage | VEB | - | - | 5 | V | - |
| Base-Emitter Saturation Voltage | VBE(sat) | 1.8 | 2.2 | 2.6 | V | IC = 15 A, IB = 3 A |
| Collector-Emitter Saturation Voltage | VCE(sat) | 1.8 | 2.2 | 2.6 | V | IC = 15 A, IB = 3 A |
| Storage Temperature Range | Tstg | -55 | - | 150 | °C | - |
| Operating Junction Temperature | Tj(op) | -55 | - | 150 | °C | - |
| Total Device Dissipation | PTOT | - | - | 180 | W | Tc = 25°C, θjc = 1.5 K/W |
| Gate Charge | QG | - | 120 | - | nC | - |
| Turn-On Delay Time | td(on) | - | 40 | - | ns | - |
| Rise Time | tr | - | 70 | - | ns | - |
| Turn-Off Delay Time | td(off) | - | 40 | - | ns | - |
| Fall Time | tf | - | 70 | - | ns | - |
Instructions for Use:
Handling Precautions:
- Handle the device with care to avoid mechanical damage.
- Use appropriate ESD protection when handling the device to prevent damage from static electricity.
Mounting and Assembly:
- Ensure proper heat sinking to maintain the junction temperature within the specified range.
- Follow the recommended PCB layout guidelines to minimize parasitic inductances and improve thermal performance.
Biasing and Drive:
- Apply sufficient base current to ensure the transistor operates in the saturation region for minimum VCE(sat).
- Use a fast turn-on and turn-off circuit to reduce switching losses.
Thermal Management:
- Monitor the junction temperature during operation to ensure it does not exceed the maximum operating temperature.
- Use thermal paste or thermal interface materials between the device and the heat sink for better thermal conductivity.
Storage:
- Store the device in a dry, cool place to prevent moisture damage.
- Keep the device in its original packaging until ready for use.
Testing:
- Perform initial testing at low power levels to verify correct operation before applying full load conditions.
- Use a suitable test setup to measure key parameters such as VCE(sat), IC, and switching times.
Safety:
- Ensure that all electrical connections are secure and insulated to prevent short circuits.
- Follow all relevant safety standards and regulations when designing and testing circuits containing this device.
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