IKW30N60DTP

IKW30N60DTP

Category: IC ChipsDriver Ics

Specifications
SKU
9462371
Details

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Parameter Symbol Min Typ Max Unit Conditions
Collector-Emitter Voltage VCE - 600 - V -
Collector Current IC - - 30 A Tj = 25°C
Collector Current (Pulsed) IC(rms) - - 45 A Tj = 25°C, Pulse Width ≤ 10 μs, Duty Cycle ≤ 1%
Emitter-Base Voltage VEB - - 5 V -
Base-Emitter Saturation Voltage VBE(sat) 1.8 2.2 2.6 V IC = 15 A, IB = 3 A
Collector-Emitter Saturation Voltage VCE(sat) 1.8 2.2 2.6 V IC = 15 A, IB = 3 A
Storage Temperature Range Tstg -55 - 150 °C -
Operating Junction Temperature Tj(op) -55 - 150 °C -
Total Device Dissipation PTOT - - 180 W Tc = 25°C, θjc = 1.5 K/W
Gate Charge QG - 120 - nC -
Turn-On Delay Time td(on) - 40 - ns -
Rise Time tr - 70 - ns -
Turn-Off Delay Time td(off) - 40 - ns -
Fall Time tf - 70 - ns -

Instructions for Use:

  1. Handling Precautions:

    • Handle the device with care to avoid mechanical damage.
    • Use appropriate ESD protection when handling the device to prevent damage from static electricity.
  2. Mounting and Assembly:

    • Ensure proper heat sinking to maintain the junction temperature within the specified range.
    • Follow the recommended PCB layout guidelines to minimize parasitic inductances and improve thermal performance.
  3. Biasing and Drive:

    • Apply sufficient base current to ensure the transistor operates in the saturation region for minimum VCE(sat).
    • Use a fast turn-on and turn-off circuit to reduce switching losses.
  4. Thermal Management:

    • Monitor the junction temperature during operation to ensure it does not exceed the maximum operating temperature.
    • Use thermal paste or thermal interface materials between the device and the heat sink for better thermal conductivity.
  5. Storage:

    • Store the device in a dry, cool place to prevent moisture damage.
    • Keep the device in its original packaging until ready for use.
  6. Testing:

    • Perform initial testing at low power levels to verify correct operation before applying full load conditions.
    • Use a suitable test setup to measure key parameters such as VCE(sat), IC, and switching times.
  7. Safety:

    • Ensure that all electrical connections are secure and insulated to prevent short circuits.
    • Follow all relevant safety standards and regulations when designing and testing circuits containing this device.
(For reference only)

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