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BUY W25Q16DVSSJG https://www.utsource.net/itm/p/9768063.html
IC FLASH MEMORY 16MB
Parameter | Symbol | Min | Typ | Max | Unit | Description |
---|---|---|---|---|---|---|
Supply Voltage | Vcc | 2.7 | - | 3.6 | V | Operating supply voltage range |
Standby Current | Icc | - | 1 | 5 | μA | Supply current in standby mode |
Active Current (Read) | Icc | - | 4 | 8 | mA | Supply current during read operation |
Programming Current | Icc | - | 5 | 10 | mA | Supply current during programming |
Erase Current | Icc | - | 10 | 20 | mA | Supply current during erase operation |
Data Output High Level | VOH | 2.4 | - | Vcc | V | Minimum output high level |
Data Output Low Level | VOL | 0 | - | 0.4 | V | Maximum output low level |
Input High Level | VIH | 2.0 | - | Vcc | V | Minimum input high level |
Input Low Level | VIL | 0 | - | 0.8 | V | Maximum input low level |
Access Time | tACC | 0 | 0.07 | 0.1 | μs | Access time from CE# low to valid output data |
Page Program Time | tPP | - | 2.5 | 4 | ms | Typical page program time |
Sector Erase Time | tSE | - | 200 | 300 | ms | Typical sector erase time |
Bulk Erase Time | tBE | - | 20 | 30 | s | Typical bulk erase time |
Write Enable Time | tWEL | 0 | 0.1 | 1 | μs | Write enable latch time |
Write Disable Time | tWDS | 0 | 0.1 | 1 | μs | Write disable latch time |
Chip Enable Setup Time | tCES | 0 | 0 | 10 | ns | Chip enable setup time before falling edge of WE# or RE# |
Chip Enable Hold Time | tCEH | 0 | 0 | 10 | ns | Chip enable hold time after falling edge of WE# or RE# |
Write Enable/Disable Setup | tWES | 0 | 0 | 10 | ns | Write enable/disable setup time before falling edge of WE# |
Write Enable/Disable Hold | tWEH | 0 | 0 | 10 | ns | Write enable/disable hold time after falling edge of WE# |
Read Cycle Time | tRC | 0 | 0.1 | 0.15 | μs | Read cycle time |
Write Cycle Time | tWC | 0 | 0.1 | 0.15 | μs | Write cycle time |
Instructions for Using W25Q16DVSSJG
Power Supply:
- Ensure the supply voltage (Vcc) is within the specified range of 2.7V to 3.6V.
Standby Mode:
- To enter standby mode, set the chip enable (CE#) pin to high. The current consumption will be minimal (1-5 μA).
Active Mode:
- Set the CE# pin to low to activate the device. The current consumption will increase depending on the operation (read, program, or erase).
Read Operation:
- Apply the read command sequence to the device.
- Ensure the access time (tACC) is respected to avoid data corruption.
- The data output high (VOH) and low (VOL) levels must be within the specified limits.
Write Operation:
- Before writing, ensure the write enable (WREN) command is issued.
- The write enable latch time (tWEL) must be observed.
- After writing, issue the write disable (WRDI) command to prevent accidental writes.
Program Operation:
- Use the page program command to write data to the device.
- The typical page program time (tPP) is 2.5 ms, but it can take up to 4 ms.
Erase Operation:
- Use the sector erase or bulk erase commands to erase memory.
- The typical sector erase time (tSE) is 200 ms, and the bulk erase time (tBE) is 20 seconds.
Timing Requirements:
- Adhere to the timing parameters such as setup and hold times for CE#, WE#, and RE# to ensure reliable operation.
- Respect the read cycle time (tRC) and write cycle time (tWC) to avoid timing violations.
Data Protection:
- Use the status register to monitor the busy status of the device during write and erase operations.
- Implement error checking and handling mechanisms to ensure data integrity.
By following these instructions and adhering to the specified parameters, you can ensure reliable and efficient operation of the W25Q16DVSSJG flash memory.
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