TLP261J(F)
Specifications
SKU
9772069
Details
BUY TLP261J(F) https://www.utsource.net/itm/p/9772069.html
| Parameter | Symbol | Min | Typ | Max | Unit | Condition |
|---|---|---|---|---|---|---|
| Forward Voltage | VF | - | 1.2 | 1.5 | V | IF = 20 mA |
| Reverse Breakdown Voltage | VBR | 5 | - | 7 | V | IR = 10 渭A |
| Continuous Forward Current | IF | - | - | 30 | mA | Ta = 25掳C |
| Peak Forward Current | IF(surge) | - | - | 100 | mA | t = 10 ms, Repetition Rate = 100/s |
| Storage Temperature | TSTG | -40 | - | 85 | 掳C | - |
| Operating Temperature | TA | -40 | - | 85 | 掳C | - |
| Output Leakage Current | IOL | - | 1 | 5 | 渭A | VO = 0 V, TA = 25掳C |
| Output Turn-ON Time | ton | - | 2 | 5 | 渭s | VI = 5 V, RL = 1 k惟, CL = 100 pF |
| Output Turn-OFF Time | toff | - | 2 | 5 | 渭s | VI = 0 V, RL = 1 k惟, CL = 100 pF |
Instructions for Use:
Mounting and Handling:
- Handle the TLP261J(F) with care to avoid mechanical stress.
- Ensure proper grounding to prevent electrostatic discharge (ESD).
Power Supply:
- Apply the forward current (IF) within the specified limits to avoid overheating and damage.
- Ensure the reverse voltage (VBR) does not exceed the maximum rating.
Temperature Considerations:
- Operate the device within the specified temperature range (TA and TSTG) to ensure reliable performance.
- Provide adequate heat dissipation if operating at high temperatures or high currents.
Signal Integrity:
- Use appropriate decoupling capacitors to filter out noise and ensure stable operation.
- Keep signal traces short to minimize inductance and capacitance effects.
Storage:
- Store the device in a dry, cool place to prevent moisture damage.
- Follow ESD handling guidelines during storage and transportation.
Testing:
- Use a constant current source to test the forward voltage (VF).
- Measure the output leakage current (IOL) under no-load conditions to verify proper operation.
Safety:
- Ensure all connections are secure and insulated to prevent short circuits.
- Follow all relevant safety standards and regulations when designing and testing circuits.
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