Details
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| Parameter | Description | Value |
|---|---|---|
| Part Number | Full part number of the component | SDIN5C1-8G |
| Type | Type of component | NAND Flash Memory |
| Capacity | Storage capacity of the component | 8 Gb |
| Interface | Data interface type | ONFI 2.3 |
| Voltage (Vcc) | Operating voltage range | 1.7 V to 1.95 V |
| Temperature | Operating temperature range | -40°C to +85°C |
| Package | Package type | BGA 169 |
| Data Rate | Maximum data transfer rate | 200 MB/s |
| Endurance | Program/Erase cycles | 3,000 cycles |
| Retention | Data retention | 10 years at 25°C |
| Organization | Internal memory organization | 16 x 32 Gb |
| Die Size | Size of the die | 172 mm2 |
| RoHS Compliance | Compliance with RoHS standards | Yes |
Instructions for Use
Power Supply:
- Ensure that the supply voltage (Vcc) is within the specified range of 1.7 V to 1.95 V.
- Connect the power supply to the appropriate pins on the BGA 169 package.
Interface Configuration:
- Configure the ONFI 2.3 interface according to the device datasheet.
- Ensure that the data lines, clock, and control signals are correctly connected.
Initialization:
- After power-up, initialize the device by sending the appropriate commands as specified in the ONFI 2.3 standard.
- Verify the device ID and status to ensure proper initialization.
Read/Write Operations:
- Use the read and write commands to access the memory.
- Ensure that the address and data lines are correctly set for each operation.
- Follow the timing diagrams provided in the datasheet for correct timing of signals.
Erase Operations:
- Before writing new data, perform a block erase operation if necessary.
- Ensure that the block to be erased is not currently being accessed by another operation.
Error Handling:
- Monitor the status registers for any errors during read, write, or erase operations.
- Implement error handling routines to manage any detected issues.
Thermal Management:
- Ensure that the operating temperature remains within the specified range of -40°C to +85°C.
- Provide adequate cooling if the device is expected to operate in high-temperature environments.
Storage and Handling:
- Store the device in a dry, static-free environment when not in use.
- Handle the device with care to avoid damage to the BGA package.
End-of-Life Considerations:
- Plan for the end-of-life of the device, considering its endurance of 3,000 program/erase cycles.
- Implement wear-leveling algorithms to distribute write operations evenly across the memory.
For detailed information, refer to the specific datasheet and application notes provided by the manufacturer.
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