Details
BUY AO4406 https://www.utsource.net/itm/p/11246194.html
| Parameter | Symbol | Min | Typ | Max | Unit | Condition |
|---|---|---|---|---|---|---|
| Input Voltage | VDS | -0.3 | 30 | V | ||
| Gate-Source Voltage | VGS | -0.3 | 12 | V | ||
| Continuous Drain Current | ID | 6.5 | A | TC = 25°C | ||
| Pulse Drain Current | IDpeak | 9 | A | TC = 25°C, tp = 100 μs, frep = 100 Hz | ||
| Gate Charge | QG | 28 | nC | VGS = 10 V, ID = 6.5 A | ||
| Total Power Dissipation | PTOT | 1.5 | W | TC = 25°C | ||
| Junction Temperature | TJ | 150 | °C | |||
| Storage Temperature | TSTG | -55 | 150 | °C |
Instructions for AO4406
Handling Precautions:
- The AO4406 is sensitive to electrostatic discharge (ESD). Use proper ESD protection when handling the device.
- Avoid exposing the device to temperatures outside its specified operating range.
Mounting:
- Ensure good thermal management by using a heatsink if necessary, especially when operating at high currents or power dissipation.
- Follow recommended PCB layout guidelines to minimize parasitic inductance and capacitance.
Biasing:
- Apply the gate-source voltage (VGS) within the specified limits to avoid damage to the device.
- For optimal performance, ensure that the gate drive circuitry can provide sufficient current to charge and discharge the gate capacitance quickly.
Operation:
- Operate the device within its continuous drain current (ID) and total power dissipation (PTOT) ratings to prevent overheating and potential failure.
- Monitor the junction temperature (TJ) to ensure it does not exceed 150°C.
Testing:
- When testing the device, use appropriate test equipment and follow safety guidelines to avoid damaging the device or causing injury.
- Verify that all connections are secure and correct before applying power.
Storage:
- Store the device in a dry, cool environment within the specified storage temperature range (-55°C to 150°C).
- Protect the device from moisture and physical damage during storage and transportation.
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