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BUY RTF015N03 https://www.utsource.net/itm/p/11286797.html
RTF015N03 MOSFET N-Channel 30V 1.5A SOT-323/SC-70/UMT3 marking PP ESD protection gate
Parameter | Symbol | Conditions | Min | Typ | Max | Unit |
---|---|---|---|---|---|---|
Forward Voltage | VF | IF = 1 A | - | 0.3 | 0.4 | V |
Reverse Recovery Time | trr | IF = 1 A, VR = 30 V | - | 35 | - | ns |
Continuous Forward Current | IF | TA = 25掳C | - | 1.5 | - | A |
Pulse Forward Current | IFsm | tp = 8.3 ms, TA = 25掳C | - | 3 | - | A |
Maximum Reverse Voltage | VR | - | - | 30 | - | V |
Operating Junction Temperature | TJ(op) | - | - | 150 | - | 掳C |
Storage Temperature Range | Tstg | - | -65 | - | 150 | 掳C |
Instructions for Use:
Forward Voltage (VF):
- Ensure that the forward voltage does not exceed 0.4V at a forward current of 1A to avoid excessive power dissipation.
Reverse Recovery Time (trr):
- The reverse recovery time is critical for high-frequency applications. Ensure that the circuit design accounts for a maximum recovery time of 35ns.
Continuous Forward Current (IF):
- Do not exceed a continuous forward current of 1.5A at an ambient temperature of 25掳C to prevent overheating and potential damage.
Pulse Forward Current (IFsm):
- For pulse applications, the device can handle up to 3A with a pulse width of 8.3ms at an ambient temperature of 25掳C. Ensure that the duty cycle and frequency are within safe limits.
Maximum Reverse Voltage (VR):
- The maximum reverse voltage should not exceed 30V to avoid breakdown and potential failure of the device.
Operating Junction Temperature (TJ(op)):
- The device can operate safely with a junction temperature up to 150掳C. Ensure proper heat dissipation and thermal management to maintain this limit.
Storage Temperature Range (Tstg):
- Store the device in an environment with a temperature range of -65掳C to 150掳C to ensure long-term reliability.
Additional Notes:
- Always refer to the datasheet for the most accurate and detailed information.
- Proper PCB layout and thermal management are crucial for optimal performance and longevity of the device.
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