RTF015N03

RTF015N03

Category: TransistorsDiodes

Specifications
SKU
11286797
Details

BUY RTF015N03 https://www.utsource.net/itm/p/11286797.html
RTF015N03 MOSFET N-Channel 30V 1.5A SOT-323/SC-70/UMT3 marking PP ESD protection gate
Parameter Symbol Conditions Min Typ Max Unit
Forward Voltage VF IF = 1 A - 0.3 0.4 V
Reverse Recovery Time trr IF = 1 A, VR = 30 V - 35 - ns
Continuous Forward Current IF TA = 25掳C - 1.5 - A
Pulse Forward Current IFsm tp = 8.3 ms, TA = 25掳C - 3 - A
Maximum Reverse Voltage VR - - 30 - V
Operating Junction Temperature TJ(op) - - 150 - 掳C
Storage Temperature Range Tstg - -65 - 150 掳C

Instructions for Use:

  1. Forward Voltage (VF):

    • Ensure that the forward voltage does not exceed 0.4V at a forward current of 1A to avoid excessive power dissipation.
  2. Reverse Recovery Time (trr):

    • The reverse recovery time is critical for high-frequency applications. Ensure that the circuit design accounts for a maximum recovery time of 35ns.
  3. Continuous Forward Current (IF):

    • Do not exceed a continuous forward current of 1.5A at an ambient temperature of 25掳C to prevent overheating and potential damage.
  4. Pulse Forward Current (IFsm):

    • For pulse applications, the device can handle up to 3A with a pulse width of 8.3ms at an ambient temperature of 25掳C. Ensure that the duty cycle and frequency are within safe limits.
  5. Maximum Reverse Voltage (VR):

    • The maximum reverse voltage should not exceed 30V to avoid breakdown and potential failure of the device.
  6. Operating Junction Temperature (TJ(op)):

    • The device can operate safely with a junction temperature up to 150掳C. Ensure proper heat dissipation and thermal management to maintain this limit.
  7. Storage Temperature Range (Tstg):

    • Store the device in an environment with a temperature range of -65掳C to 150掳C to ensure long-term reliability.

Additional Notes:

  • Always refer to the datasheet for the most accurate and detailed information.
  • Proper PCB layout and thermal management are crucial for optimal performance and longevity of the device.
(For reference only)

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