Details
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FMMT489TA NPN Transistors(BJT) 50V 1A 150MHz 100~300 600mV/0.6V SOT-23/SC-59 marking 489
Parameter | Symbol | Test Conditions | Min | Typical | Max | Unit |
---|---|---|---|---|---|---|
Collector-Emitter Voltage | VCEO | IC = 150 mA, IB = 0 | - | - | 30 | V |
Emitter-Collector Voltage | VEBO | IE = 5 mA, IC = 0 | - | - | 5 | V |
Base-Emitter Voltage | VBE | IC = 150 mA, IB = 15 mA | - | 0.7 | - | V |
Collector Current | IC | VCE = 30 V | - | 150 | - | mA |
Base Current | IB | VCE = 30 V, IC = 150 mA | - | 15 | - | mA |
DC Current Gain | hFE | IC = 150 mA, VCE = 10 V | 100 | 300 | - | - |
Transition Frequency | fT | IC = 150 mA, VCE = 10 V | - | 250 | - | MHz |
Storage Temperature Range | TSTG | - | -65 | - | 150 | 掳C |
Operating Junction Temperature | TJ | - | -65 | - | 150 | 掳C |
Instructions for Use:
Handling:
- Handle with care to avoid static damage.
- Use appropriate ESD (Electrostatic Discharge) protection when handling the device.
Mounting:
- Ensure proper alignment of the pins during mounting.
- Use recommended soldering temperatures and times to avoid thermal stress on the device.
Biasing:
- Ensure that the base-emitter voltage (VBE) is within the specified range to avoid damage.
- Keep the collector current (IC) within the maximum ratings to prevent overheating and failure.
Operating Conditions:
- Operate the device within the specified temperature ranges to ensure reliable performance.
- Monitor the junction temperature (TJ) to avoid exceeding the maximum operating temperature.
Storage:
- Store the device in a dry, cool place to prevent moisture damage.
- Follow the storage temperature range (TSTG) to maintain the integrity of the device.
Testing:
- Use the specified test conditions to accurately measure the parameters of the device.
- Refer to the datasheet for detailed testing procedures and equipment requirements.
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