Details
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Parameter | Symbol | Min | Typical | Max | Unit | Notes |
---|---|---|---|---|---|---|
Drain-Source Voltage | VDS | - | 100 | V | ||
Gate-Source Voltage | VGS | -15 | 20 | V | ||
Continuous Drain Current | ID | - | 48 | 60 | A | @ TC = 25掳C, VGS = 10V |
Pulse Drain Current | ID(p) | - | 120 | - | A | @ tp = 10ms, IGM = 48A, VGS = 10V |
Power Dissipation | PTOT | - | 340 | W | @ TC = 25掳C | |
Junction Temperature | TJ | - | 175 | 掳C | ||
Storage Temperature | TSTG | -55 | 150 | 掳C | ||
Thermal Resistance | R胃JC | - | 0.5 | - | 掳C/W | Case to Junction |
Total Gate Charge | QG | - | 94 | - | nC | @ VGS = 10V, VDS = 50V, ID = 30A |
Input Capacitance | Ciss | - | 1450 | - | pF | @ VDS = 25V, f = 1MHz |
Output Capacitance | Coss | - | 340 | - | pF | @ VDS = 25V, f = 1MHz |
Reverse Transfer Capacitance | Crss | - | 110 | - | pF | @ VDS = 25V, f = 1MHz |
On-State Resistance | RDS(on) | - | 4.5 | - | m惟 | @ VGS = 10V, ID = 30A, TJ = 25掳C |
Instructions for Use:
Mounting and Handling:
- Ensure proper heat sinking to manage the thermal resistance and keep the junction temperature within safe limits.
- Handle the device with care to avoid damage to the leads and the die.
Biasing and Operation:
- Apply the gate-source voltage (VGS) within the specified range to avoid damaging the device.
- Ensure that the drain-source voltage (VDS) does not exceed the maximum rating to prevent breakdown.
Current Limiting:
- Do not exceed the continuous drain current (ID) or pulse drain current (ID(p)) ratings to avoid overheating and potential failure.
- Use appropriate current limiting resistors if necessary.
Thermal Management:
- Monitor the junction temperature (TJ) and ensure it remains below the maximum rating.
- Use thermal paste or other thermal management techniques to improve heat dissipation.
Storage and Environment:
- Store the device in a dry, cool environment to prevent moisture damage.
- Avoid exposing the device to temperatures outside the storage temperature range (TSTG).
Testing and Troubleshooting:
- Test the device under controlled conditions to verify its performance parameters.
- If the device fails to meet specifications, check for proper biasing, thermal management, and environmental conditions.
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