Details

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Parameter	Symbol	Min	Typ	Max	Unit	Conditions/Notes
Input Forward Voltage	VIF	-	1.2	1.6	V	@ IF = 10 mA, TA = 25掳C
Input Current	IF	-	5	15	mA	@ VIF = 1.4 V, TA = 25掳C
Output Collector-Emitter Voltage	VCE(sat)	-	0.35	0.5	V	@ IC = 10 mA, TA = 25掳C
Output Collector Current	IC	-	10	15	mA	@ VCE = 5 V, TA = 25掳C
Output Turn-On Time	ton	-	1	2	渭s	@ IF = 10 mA, IC = 10 mA, TA = 25掳C
Output Turn-Off Time	toff	-	1	2	渭s	@ IF = 10 mA, IC = 10 mA, TA = 25掳C
Isolation Voltage	VIORM	-	-	5000	Vrms	1 minute, 50/60 Hz, TA = 25掳C
Operating Temperature	TOP	-40	-	85	掳C
Storage Temperature	TSTG	-40	-	100	掳C

Instructions for Use

1. Power Supply:

   • Ensure that the input voltage (V_IF) is within the specified range to avoid damage to the device.
   • The output collector-emitter voltage (V_CE(sat)) should not exceed the maximum rating.

2. Current Handling:

   • The input current (I_F) should be set to the typical value for optimal performance.
   • The output collector current (I_C) should not exceed the maximum rating to prevent overheating.

3. Timing:

   • The turn-on time (t_on) and turn-off time (t_off) are critical for timing-sensitive applications. Ensure that these times are within acceptable limits for your application.

4. Isolation:

   • The isolation voltage (V_IORM) ensures that there is sufficient electrical isolation between the input and output circuits. Do not exceed this voltage to maintain safety and reliability.

5. Temperature:

   • Operate the device within the specified operating temperature range (T_OP) to ensure reliable performance.
   • Store the device within the storage temperature range (T_STG) to prevent damage during storage.

6. Handling:

   • Handle the device with care to avoid mechanical damage.
   • Follow ESD (Electrostatic Discharge) precautions to prevent damage from static electricity.

7. Mounting:

   • Mount the device on a suitable PCB with proper soldering techniques to ensure good electrical connections and thermal management.

8. Testing:

   • Before finalizing the design, test the device under actual operating conditions to verify performance and reliability.

(For reference only)