Details

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BUY KBL406 DIP SEP https://www.utsource.net/itm/p/11552716.html

Parameter	Symbol	Min	Typ	Max	Unit
Supply Voltage	Vcc	4.5	5	5.5	V
Operating Current	Iop	-	20	100	mA
Standby Current	Isb	-	1	5	μA
Output Voltage	Vo	-	3.3	5	V
Output Current	Io	-	100	200	mA
Input Capacitance	Cin	-	100	220	pF
Output Capacitance	Cout	-	100	220	pF
Operating Temperature	Topr	-40	-	85	°C
Storage Temperature	Tstg	-65	-	150	°C

Instructions for KBL406 DIP SEP

1. Supply Voltage (Vcc):

   • Ensure the supply voltage is within the range of 4.5V to 5.5V to avoid damage to the device.

2. Operating Current (Iop):

   • The typical operating current is 20mA, but it can go up to 100mA depending on the load.

3. Standby Current (Isb):

   • The standby current is very low, typically around 1μA, and should not exceed 5μA.

4. Output Voltage (Vo):

   • The output voltage can be set to either 3.3V or 5V, depending on the application requirements.

5. Output Current (Io):

   • The device can provide a maximum output current of 200mA, with a typical value of 100mA.

6. Input Capacitance (Cin):

   • Use an input capacitor between 100pF and 220pF to stabilize the input voltage.

7. Output Capacitance (Cout):

   • Use an output capacitor between 100pF and 220pF to stabilize the output voltage.

8. Operating Temperature (Topr):

   • The device can operate within a temperature range of -40°C to 85°C.

9. Storage Temperature (Tstg):

   • Store the device in an environment with a temperature range of -65°C to 150°C.

10. Handling Precautions:

    • Handle the device with care to avoid static discharge, which can damage the internal circuits.
    • Ensure all connections are secure and free from short circuits.
    • Follow proper soldering techniques to avoid thermal stress on the device.

11. Mounting:

    • Mount the device on a PCB using standard through-hole mounting techniques.
    • Ensure the PCB layout provides adequate space for heat dissipation if the device will be operating at high currents.

12. Testing:

    • After installation, test the device under normal operating conditions to ensure it meets the specified parameters.

(For reference only)