IXFP22N65X2M

IXFP22N65X2M

Category: Transistors

Specifications
SKU
11603792
Details

BUY IXFP22N65X2M https://www.utsource.net/itm/p/11603792.html

Parameter Symbol Min Typ Max Unit Notes
Collector-Emitter Voltage VCE(off) - - 650 V
Gate-Source Voltage VGS -15 - 20 V
Continuous Drain Current ID(on) - 22 - A @ TC = 25掳C
Pulse Drain Current IDM - 88 - A tp = 10 渭s, IG = 10 A
Power Dissipation PTOT - - 470 W @ TC = 25掳C
Junction Temperature TJ - - 150 掳C
Storage Temperature Range TSTG -55 - 150 掳C
Thermal Resistance R胃JC - 0.7 - 掳C/W
On-State Resistance RDS(on) - 0.16 - @ VGS = 15 V, ID = 22 A
Turn-On Delay Time td(on) - 43 - ns @ ID = 10 A, VGS = 15 V, RG = 3 惟
Rise Time tr - 49 - ns @ ID = 10 A, VGS = 15 V, RG = 3 惟
Turn-Off Delay Time td(off) - 35 - ns @ ID = 10 A, VGS = 15 V, RG = 3 惟
Fall Time tf - 54 - ns @ ID = 10 A, VGS = 15 V, RG = 3 惟

Instructions for Use:

  1. Mounting and Handling:

    • Ensure proper handling to avoid static damage.
    • Use appropriate thermal management techniques to keep the junction temperature within safe limits.
  2. Electrical Connections:

    • Connect the gate and source pins carefully to avoid short circuits.
    • Use a gate resistor (RG) to control switching times and reduce EMI.
  3. Thermal Management:

    • Mount the device on a suitable heat sink to manage power dissipation effectively.
    • Ensure adequate airflow or cooling to maintain the junction temperature below 150掳C.
  4. Operating Conditions:

    • Do not exceed the maximum ratings for voltage, current, and power dissipation.
    • Operate within the specified temperature range to ensure reliable performance.
  5. Testing and Validation:

    • Perform thorough testing under actual operating conditions to validate the performance and reliability of the device.
    • Use appropriate test equipment to measure parameters such as on-state resistance and switching times.
  6. Storage:

    • Store the device in a dry, cool place to prevent moisture damage.
    • Follow recommended storage practices to maintain the integrity of the device.
(For reference only)

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