CY7C185-15PC

CY7C185-15PC


Specifications
SKU
11655264
Details

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Parameter Description Value
Part Number Device identifier CY7C185-15PC
Type Memory Type Static RAM (SRAM)
Organization Memory Organization 2K x 9
Density Total Memory Density 18 Kbits
Supply Voltage (Vcc) Operating Supply Voltage 5.0 V
Operating Temperature Temperature Range for Operation 0掳C to 70掳C
Access Time Maximum Access Time 15 ns
Cycle Time Minimum Cycle Time 15 ns
Data Retention Data Retention Time at Maximum Operating Temperature 10 years
Power Consumption Active Power Consumption 350 mW
Standby Current Standby Current 10 渭A
Package Package Type Plastic DIP (PDIP)
Pin Count Number of Pins 24
Input/Output Voltage Input/Output Voltage Levels 5.0 V
Write Enable (WE#) Write Enable Pin Active Low
Chip Enable (CE#) Chip Enable Pin Active Low
Output Enable (OE#) Output Enable Pin Active Low
Address Lines Number of Address Lines 11
Data Lines Number of Data Lines 9

Instructions for Use

  1. Power Supply:

    • Connect the Vcc pin to a 5.0V power supply.
    • Connect the GND pin to ground.
  2. Addressing:

    • Apply the desired address to the address lines (A0-A10).
  3. Data Input/Output:

    • Data is read from or written to the data lines (D0-D8).
  4. Control Signals:

    • Chip Enable (CE#): Set CE# low to enable the device.
    • Output Enable (OE#): Set OE# low to enable data output.
    • Write Enable (WE#): Set WE# low to write data to the selected address.
  5. Timing:

    • Ensure that all control signals (CE#, OE#, WE#) meet the specified timing requirements for reliable operation.
    • The access time and cycle time must be adhered to for correct data read/write operations.
  6. Handling:

    • Handle the device with care to avoid damage to the pins and internal circuitry.
    • Follow proper ESD (Electrostatic Discharge) precautions to prevent damage.
  7. Storage:

    • Store the device in a dry, cool environment to ensure long-term reliability.
  8. Testing:

    • Before integrating the device into a system, perform basic functionality tests to ensure it meets the specified parameters.

For detailed application notes and further information, refer to the datasheet provided by Cypress Semiconductor.

(For reference only)

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