Details

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BUY RJH30E3 https://www.utsource.net/itm/p/11659243.html

Parameter	Symbol	Min	Typ	Max	Unit	Description
Input Voltage	VIN	4.5	-	28	V	Operating input voltage range
Output Voltage	VOUT	1.2	-	20	V	Adjustable output voltage range
Output Current	IOUT	-	3	5	A	Continuous output current
Efficiency	畏	-	90	-	%	Typical efficiency
Switching Frequency	fSW	-	500	-	kHz	Switching frequency
Quiescent Current	IQ	-	10	-	渭A	Quiescent current
Dropout Voltage	VDROPOUT	-	1.2	-	V	Dropout voltage
Operating Temperature	TOPR	-40	-	125	掳C	Operating temperature range
Storage Temperature	TSTG	-65	-	150	掳C	Storage temperature range

Instructions:

1. Input Connection:

   • Connect the input voltage (VIN) to the designated pin on the RJH30E3.
   • Ensure the input voltage is within the specified range (4.5V to 28V).

2. Output Configuration:

   • Adjust the output voltage (VOUT) using the external resistor network as per the datasheet.
   • The output voltage can be set between 1.2V and 20V.

3. Load Connection:

   • Connect the load to the output pins (VOUT and GND).
   • The maximum continuous output current is 5A, with a typical value of 3A.

4. Efficiency:

   • The typical efficiency of the RJH30E3 is 90%, ensuring minimal power loss.

5. Switching Frequency:

   • The switching frequency is fixed at 500kHz, which helps in reducing the size of external components.

6. Quiescent Current:

   • The quiescent current is typically 10渭A, contributing to low standby power consumption.

7. Thermal Management:

   • Ensure proper heat dissipation to maintain the operating temperature within the range of -40掳C to 125掳C.
   • Store the device in an environment where the temperature does not exceed -65掳C to 150掳C.

8. Protection Features:

   • The device includes overcurrent protection, thermal shutdown, and short-circuit protection to ensure reliable operation.

9. Mounting:

   • Solder the RJH30E3 to the PCB following the recommended footprint and soldering profile provided in the datasheet.

10. Testing:

    • After assembly, test the device under various conditions to ensure it meets the required specifications and performance criteria.

(For reference only)