IRFB4127

IRFB4127

Category: Transistors

Specifications
SKU
11661404
Details

BUY IRFB4127 https://www.utsource.net/itm/p/11661404.html

Parameter Symbol Min Typical Max Unit Notes
Continuous Drain Current ID - 80 - A @ TC = 25掳C, VGS = 10V
Pulse Drain Current IDpeak - 360 - A @ TC = 25掳C, t = 10渭s, Duty Cycle = 1%
Gate-Source Voltage VGS -20 - 20 V -
Drain-Source Breakdown Voltage BVdss 55 - 60 V -
RDS(on) RDS(on) 1.4 - 2.0 m惟 @ VGS = 10V, ID = 80A, TC = 25掳C
Gate Charge Qg - 125 - nC -
Input Capacitance Ciss - 1590 - pF @ VDS = 15V, VGS = 0V to 10V, f = 1MHz
Output Capacitance Coss - 230 - pF @ VDS = 15V, VGS = 0V, f = 1MHz
Reverse Transfer Capacitance Crss - 380 - pF @ VDS = 15V, VGS = 0V to 10V, f = 1MHz
Total Power Dissipation Ptot - 360 - W @ TC = 25掳C
Junction Temperature TJ -55 - 175 掳C -
Storage Temperature Tstg -55 - 150 掳C -

Instructions for Use:

  1. Handling and Storage:

    • Store the IRFB4127 in a dry, cool place.
    • Handle with care to avoid damage to the leads and the die.
  2. Mounting:

    • Ensure proper heat sinking to manage thermal resistance.
    • Use a suitable heatsink to keep the junction temperature within the specified limits.
  3. Electrical Connections:

    • Connect the drain (D), source (S), and gate (G) terminals correctly.
    • Ensure that the gate-source voltage (VGS) does not exceed the maximum rating of 卤20V.
  4. Thermal Management:

    • Monitor the junction temperature (TJ) to ensure it does not exceed 175掳C.
    • Use thermal paste or thermal interface materials between the device and the heatsink for better thermal conductivity.
  5. Pulse Operation:

    • For pulse operation, ensure that the pulse width and duty cycle do not exceed the specified limits to avoid overheating.
  6. Gate Drive:

    • Provide sufficient gate drive to ensure the MOSFET is fully turned on, reducing RDS(on) and power dissipation.
    • Use a low impedance gate driver to minimize switching losses.
  7. Protective Circuits:

    • Consider adding overvoltage and overcurrent protection circuits to safeguard the MOSFET from transient conditions.
  8. Testing:

    • Test the device under controlled conditions to verify its performance and reliability.
    • Follow the datasheet recommendations for testing procedures.

By adhering to these guidelines, you can ensure optimal performance and longevity of the IRFB4127 MOSFET.

(For reference only)

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