2SJ553STR-E

2SJ553STR-E

Category: Transistors

Specifications
Details

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Parameter Symbol Test Conditions Min Typ Max Unit
Collector-Emitter Breakdown Voltage V(BR)CEO IC = 0, IE = 0 250 - - V
Emitter-Collector Breakdown Voltage V(BR)ECS IC = 0, IB = 0 18 - - V
Collector-Base Breakdown Voltage V(BR)CBO IE = 0 250 - - V
Continuous Collector Current IC TC = 25°C - 3 5 A
Pulse Collector Current ICM t = 1 ms, TC = 25°C - 6 - A
DC Current Gain hFE IC = 0.1A, VCE = 1V 20 100 400 -
Transition Frequency fT IC = 0.1A, VCE = 1V - 2.5 - MHz
Storage Temperature Range TSTG - -55 - 150 °C
Operating Junction Temperature TJ - -55 - 150 °C

Instructions for Use:

  1. Handling Precautions:

    • Handle the 2SJ553STR-E with care to avoid damage to the pins or internal components.
    • Avoid exposure to high temperatures and humidity during storage.
  2. Mounting:

    • Ensure proper heat sinking if operating near maximum current and temperature limits.
    • Follow manufacturer guidelines for mounting torque and soldering profiles.
  3. Electrical Connections:

    • Verify correct polarity before applying voltage to prevent damage.
    • Use appropriate decoupling capacitors to minimize noise and transient effects.
  4. Operating Conditions:

    • Operate within specified temperature and current limits to ensure reliable performance.
    • Monitor junction temperature to prevent overheating.
  5. Testing:

    • Perform initial testing at room temperature and gradually increase load conditions.
    • Regularly check device parameters against datasheet specifications.
(For reference only)

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