SN74LS32NE4

SN74LS32NE4


Specifications
SKU
11690822
Details

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IC GATE OR 4CH 2-INP 14DIP
Parameter Symbol Min Typical Max Unit Notes
Supply Voltage VCC 4.75 5.0 5.25 V
Input Low Voltage VIL 0.0 0.8 - V
Input High Voltage VIH 2.0 3.5 - V
Output Low Voltage VOL 0.0 0.4 0.5 V
Output High Voltage VOH 2.7 3.5 5.0 V
Propagation Delay Time tpd - 15 22 ns
Power Dissipation PD - - 100 mW
Operating Temperature TA -55 - 125 °C
Storage Temperature TSTG -65 - 150 °C

Instructions for Use:

  1. Supply Voltage (VCC):

    • Ensure the supply voltage is within the range of 4.75V to 5.25V to avoid damage to the device.
  2. Input Voltages:

    • For a logic low input, the voltage should be less than or equal to 0.8V.
    • For a logic high input, the voltage should be greater than or equal to 2.0V.
  3. Output Voltages:

    • When the output is low, the voltage will be between 0.0V and 0.5V.
    • When the output is high, the voltage will be between 2.7V and 5.0V.
  4. Propagation Delay Time (tpd):

    • The typical propagation delay time is 15ns, with a maximum of 22ns. This is the time it takes for the output to change state after the input changes.
  5. Power Dissipation (PD):

    • The maximum power dissipation is 100mW. Ensure that the device is not subjected to excessive power to prevent overheating and potential damage.
  6. Operating Temperature (TA):

    • The device can operate within a temperature range of -55°C to 125°C. Ensure that the ambient temperature does not exceed these limits.
  7. Storage Temperature (TSTG):

    • The device can be stored in temperatures ranging from -65°C to 150°C. However, prolonged exposure to extreme temperatures may affect performance.
  8. Handling:

    • Handle the device with care to avoid static discharge, which can damage the internal circuits. Use proper ESD (Electrostatic Discharge) protection measures.
  9. Mounting:

    • Ensure that the device is properly mounted on the PCB (Printed Circuit Board) to maintain good electrical connections and thermal management.
  10. Testing:

    • Before final assembly, test the device to ensure it meets the specified parameters and functions correctly.
(For reference only)

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