Details
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Parameter | Description | Value |
---|---|---|
Device Type | Non-volatile Flash Memory | AT28HC256-70SC |
Organization | Organization | 32K x 8 bits |
Supply Voltage (VCC) | Operating Supply Voltage | 2.7V to 5.5V |
Access Time (tAC) | Access Time | 70ns |
Package Type | Package Style | SOIC-28 |
Operating Temperature | Temperature Range for Operation | -40°C to +85°C |
Write Cycle Time | Time required for a write cycle | 3ms |
Endurance | Write/Erase Cycles | 1,000,000 cycles |
Data Retention | Data retention period | 10 years |
Input/Output Voltage | I/O Voltage Levels | VIL = 0.8V, VIH = 2.0V |
Standby Current | Current Consumption in Standby Mode | 1μA max |
Active Current | Current Consumption in Active Mode | 30mA max |
Instructions:
- Powering the Device: Ensure that the supply voltage (VCC) is within the specified range of 2.7V to 5.5V.
- Addressing and Data Lines: Connect the address lines (A0-A14) to select the memory location and data lines (D0-D7) for data transfer.
- Control Signals: Use control signals such as Chip Select (CS), Output Enable (OE), and Write Enable (WE) to manage read/write operations.
- Write Operations: A write cycle takes approximately 3 milliseconds. Ensure no new operation starts until the current write cycle completes.
- Read Operations: Access time for reading data is 70 nanoseconds. Ensure the timing constraints are met for reliable data retrieval.
- Temperature Considerations: Operate the device within the temperature range of -40°C to +85°C to avoid damage or unreliable performance.
- Handling Precautions: Handle the device with care to prevent electrostatic discharge (ESD) damage, especially when interfacing with other components.
- Endurance and Retention: The device supports up to 1,000,000 write/erase cycles and retains data for up to 10 years under normal operating conditions.
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