XC95288XL-10TQG144C

XC95288XL-10TQG144C

Category: IC Chips

Specifications
SKU
12381094
Details

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Parameter Description Value
Device High-Density, Low-Cost CPLD XC95288XL-10TQG144C
Package TQFP (Thin Quad Flat Package) 144-Pin
Operating Temperature Range Industrial Temperature Range -40°C to +85°C
Supply Voltage (VCC) Operating Supply Voltage 3.3V ± 5%
I/O Voltage Input/Output Voltage 3.3V ± 5%
Logic Cells Number of Logic Cells 288
Macrocells Number of Macrocells 144
User I/O Pins Number of User I/O Pins 112
Internal RAM (Bits) Internal RAM Size 2880 bits
Maximum Frequency Maximum Operating Frequency 333 MHz (typical)
Configuration Memory Configuration Memory Type Non-Volatile Flash
Programming Method Programming Method In-System Programmable (ISP)
Configuration Modes Configuration Modes Master Serial, Slave Serial, Master Parallel, Slave Parallel, JTAG
Power Consumption Typical Power Consumption (Active) 100 mW
Standby Current Standby Current 1 μA
ESD Protection Electrostatic Discharge Protection HBM: 2000 V, MM: 200 V, CDM: 1000 V
Lead-Free Lead-Free Compliance Yes
RoHS Compliant RoHS Compliance Yes

Instructions for Use

  1. Power Supply Connection:

    • Connect the VCC pin to a 3.3V power supply.
    • Ensure that the ground (GND) pins are connected to a common ground.
  2. Configuration:

    • The device can be configured using various modes: Master Serial, Slave Serial, Master Parallel, Slave Parallel, or JTAG.
    • Use the appropriate configuration software provided by Xilinx to program the device.
  3. Input/Output Handling:

    • Ensure that all I/O pins are properly terminated to avoid floating inputs.
    • Use pull-up or pull-down resistors as needed for proper signal levels.
  4. Programming:

    • Use the Xilinx iMPACT software or another compatible programming tool to load the configuration file into the device.
    • Follow the programming sequence specified in the Xilinx documentation to ensure successful configuration.
  5. Testing:

    • After programming, test the device to verify correct operation.
    • Use boundary-scan (JTAG) testing for functional verification and debugging.
  6. Handling and Storage:

    • Handle the device with care to avoid ESD damage.
    • Store the device in a dry, ESD-safe environment.
  7. Documentation:

    • Refer to the Xilinx datasheet and user guide for detailed information on device specifications, programming, and application notes.

For more detailed information, refer to the official Xilinx documentation for the XC95288XL-10TQG144C.

(For reference only)

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