Details

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Parameter	Description	Value
Device Name		TC58NVG0S3ETAI0
Type	NAND Flash Memory
Density	Storage Capacity	128 Gb (16 GB)
Interface	Interface Type	Toggle Mode 2.0
I/O Voltage (VccQ)	Operating Voltage for I/O Pins	1.8 V ± 0.1 V
Core Voltage (Vcc)	Operating Voltage for Core	3.3 V ± 0.3 V
Data Transfer Rate	Maximum Data Transfer Rate	400 MB/s (Read), 200 MB/s (Write)
Package	Package Type	BGA-169
Operating Temperature	Industrial Temperature Range	-40°C to +85°C
ECC Requirement	Error Correction Code	Up to 24-bit ECC per 1024 bytes
Block Size	Block Size	2048 KB
Page Size	Page Size	16 KB (Data) + 816 Bytes (Spare Area)
Program/Erase Cycles	Endurance	3,000 Program/Erase Cycles
Retention Time	Data Retention	10 years at 25°C
Standby Current	Standby Current (Typical)	100 μA
Active Current	Active Current (Typical)	150 mA (Read), 200 mA (Write)
Package Dimensions	Package Size	16 mm x 12 mm x 1.2 mm

Instructions for Use:

1. Power Supply:

   • Connect the core voltage (Vcc) to 3.3 V ± 0.3 V.
   • Connect the I/O voltage (VccQ) to 1.8 V ± 0.1 V.

2. Initialization:

   • Ensure the device is powered up before applying any signals.
   • Follow the initialization sequence as specified in the datasheet to configure the device.

3. Data Access:

   • Use the appropriate command set for read, write, and erase operations.
   • Ensure the ECC (Error Correction Code) is implemented in the system to correct any bit errors during data transfer.

4. Temperature Considerations:

   • Operate the device within the industrial temperature range of -40°C to +85°C to ensure reliable performance.
   • Avoid exposing the device to temperatures outside this range for extended periods.

5. Endurance and Retention:

   • The device supports up to 3,000 program/erase cycles.
   • Data retention is guaranteed for 10 years at 25°C.

6. Handling:

   • Handle the device with care to avoid physical damage.
   • Follow ESD (Electrostatic Discharge) precautions to prevent damage from static electricity.

7. Testing:

   • Perform regular testing to ensure the device is functioning correctly.
   • Refer to the datasheet for specific test procedures and parameters.

8. Storage:

   • Store the device in a dry, cool place to prevent moisture damage.
   • Use proper anti-static packaging when storing or transporting the device.

For detailed information, refer to the official datasheet provided by the manufacturer.

(For reference only)