Details
BUY IREBM98-0291A https://www.utsource.net/itm/p/12553579.html
| Parameter | Symbol | Conditions | Min | Typ | Max | Unit |
|---|---|---|---|---|---|---|
| Breakdown Voltage | V(BR)DSS | 900 | V | |||
| Continuous Drain Current | ID | Tc = 25°C | 48 | A | ||
| Pulse Drain Current | Ibm | Pulse Width ≤ 300μs, Duty Cycle ≤ 1% | 160 | A | ||
| Gate Threshold Voltage | VGS(th) | ID = 250μA | 2.0 | 4.0 | 6.0 | V |
| Input Capacitance | Ciss | VDS = 30V, f = 1MHz | 1750 | pF | ||
| Total Power Dissipation | PD | Tc = 25°C | 360 | W | ||
| Junction Temperature | TJ | -55 | 175 | °C | ||
| Storage Temperature | Tstg | -55 | 150 | °C |
Instructions for Use:
Handling Precautions:
- The IREBM98-0291A is sensitive to ESD (Electrostatic Discharge). Use appropriate ESD protection during handling and installation.
Mounting:
- Ensure proper heat sinking to manage the junction temperature within specified limits. Use thermal grease or a thermal pad between the device and the heatsink for optimal heat transfer.
Operating Conditions:
- Do not exceed the maximum ratings listed in the table under any circumstances to avoid damaging the device.
- Ensure that the gate-source voltage (VGS) does not exceed the absolute maximum rating to prevent gate oxide damage.
Pulse Operation:
- For pulse operation, ensure that the duty cycle and pulse width are within the specified limits to avoid overheating.
Storage:
- Store the device in a dry environment within the specified storage temperature range to prevent moisture damage.
Testing:
- When testing the device, use caution with test equipment to prevent accidental over-voltage or over-current conditions that can damage the MOSFET.
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