M27C256B-90B1

M27C256B-90B1


Specifications
SKU
12591927
Details

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Parameter Description Value
Device Type High Performance CMOS Mask ROM
Organization 32K x 8
Supply Voltage (Vcc) Operating Voltage Range 4.5V to 5.5V
Access Time (tAA) Access Time at 5V, 25掳C 90ns
Data Retention Data Retention Time 10 years
Operating Temperature Industrial Temperature Range -40掳C to +85掳C
Storage Temperature Storage Temperature Range -65掳C to +150掳C
Package Type Plastic Dual In-Line Package (PDIP) 28-pin
Pin Configuration Vcc, GND, A0-A14, D0-D7, OE#, CE#
Output Drive Current Output Drive Current per Pin 卤10mA
Input Leakage Current Input Leakage Current per Pin 卤1渭A
Standby Current Standby Current at 5V, 25掳C 100渭A
Active Current Active Current at 5V, 25掳C 10mA

Instructions for Use

  1. Power Supply:

    • Ensure that the supply voltage (Vcc) is within the specified range of 4.5V to 5.5V.
    • Connect the ground (GND) pin to a stable ground reference.
  2. Addressing:

    • The device has 15 address lines (A0-A14) which are used to select one of the 32,768 memory locations.
    • Address lines should be driven by a stable and noise-free source.
  3. Data I/O:

    • The data lines (D0-D7) are used to read data from the selected memory location.
    • Data lines are tri-stated when the output enable (OE#) pin is high.
  4. Control Signals:

    • Chip Enable (CE#): When low, the device is active and can be accessed. When high, the device is in a high-impedance state.
    • Output Enable (OE#): When low, the data lines are enabled and the data from the selected memory location is output. When high, the data lines are tri-stated.
  5. Timing:

    • Ensure that the access time (tAA) is respected to avoid data corruption. The device has a typical access time of 90ns at 5V and 25掳C.
    • Proper timing must be maintained for all control signals to ensure reliable operation.
  6. Handling:

    • Handle the device with care to avoid static discharge and physical damage.
    • Store the device in a dry and cool environment to prevent degradation.
  7. Testing:

    • Before integrating the device into a system, perform basic functionality tests to ensure it meets the specified parameters.
    • Use a logic analyzer or similar tool to verify the correct operation of the device.
  8. Environmental Considerations:

    • Operate the device within the specified temperature ranges to ensure reliable performance and longevity.
    • Avoid exposing the device to extreme temperatures or humidity during storage and operation.

By following these instructions, you can ensure the optimal performance and reliability of the M27C256B-90B1 device.

(For reference only)

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