M27C256B-90B1

M27C256B-90B1

Category: IC Chips

Specifications
SKU
12591927
Details

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Parameter Description Value
Device Type High Performance CMOS Mask ROM
Organization 32K x 8
Supply Voltage (Vcc) Operating Voltage Range 4.5V to 5.5V
Access Time (tAA) Access Time at 5V, 25°C 90ns
Data Retention Data Retention Time 10 years
Operating Temperature Industrial Temperature Range -40°C to +85°C
Storage Temperature Storage Temperature Range -65°C to +150°C
Package Type Plastic Dual In-Line Package (PDIP) 28-pin
Pin Configuration Vcc, GND, A0-A14, D0-D7, OE#, CE#
Output Drive Current Output Drive Current per Pin ±10mA
Input Leakage Current Input Leakage Current per Pin ±1μA
Standby Current Standby Current at 5V, 25°C 100μA
Active Current Active Current at 5V, 25°C 10mA

Instructions for Use

  1. Power Supply:

    • Ensure that the supply voltage (Vcc) is within the specified range of 4.5V to 5.5V.
    • Connect the ground (GND) pin to a stable ground reference.
  2. Addressing:

    • The device has 15 address lines (A0-A14) which are used to select one of the 32,768 memory locations.
    • Address lines should be driven by a stable and noise-free source.
  3. Data I/O:

    • The data lines (D0-D7) are used to read data from the selected memory location.
    • Data lines are tri-stated when the output enable (OE#) pin is high.
  4. Control Signals:

    • Chip Enable (CE#): When low, the device is active and can be accessed. When high, the device is in a high-impedance state.
    • Output Enable (OE#): When low, the data lines are enabled and the data from the selected memory location is output. When high, the data lines are tri-stated.
  5. Timing:

    • Ensure that the access time (tAA) is respected to avoid data corruption. The device has a typical access time of 90ns at 5V and 25°C.
    • Proper timing must be maintained for all control signals to ensure reliable operation.
  6. Handling:

    • Handle the device with care to avoid static discharge and physical damage.
    • Store the device in a dry and cool environment to prevent degradation.
  7. Testing:

    • Before integrating the device into a system, perform basic functionality tests to ensure it meets the specified parameters.
    • Use a logic analyzer or similar tool to verify the correct operation of the device.
  8. Environmental Considerations:

    • Operate the device within the specified temperature ranges to ensure reliable performance and longevity.
    • Avoid exposing the device to extreme temperatures or humidity during storage and operation.

By following these instructions, you can ensure the optimal performance and reliability of the M27C256B-90B1 device.

(For reference only)

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