Details
BUY M27C256B-90B1 https://www.utsource.net/itm/p/12591927.html
Parameter | Description | Value |
---|---|---|
Device Type | High Performance CMOS Mask ROM | |
Organization | 32K x 8 | |
Supply Voltage (Vcc) | Operating Voltage Range | 4.5V to 5.5V |
Access Time (tAA) | Access Time at 5V, 25°C | 90ns |
Data Retention | Data Retention Time | 10 years |
Operating Temperature | Industrial Temperature Range | -40°C to +85°C |
Storage Temperature | Storage Temperature Range | -65°C to +150°C |
Package Type | Plastic Dual In-Line Package (PDIP) | 28-pin |
Pin Configuration | Vcc, GND, A0-A14, D0-D7, OE#, CE# | |
Output Drive Current | Output Drive Current per Pin | ±10mA |
Input Leakage Current | Input Leakage Current per Pin | ±1μA |
Standby Current | Standby Current at 5V, 25°C | 100μA |
Active Current | Active Current at 5V, 25°C | 10mA |
Instructions for Use
Power Supply:
- Ensure that the supply voltage (Vcc) is within the specified range of 4.5V to 5.5V.
- Connect the ground (GND) pin to a stable ground reference.
Addressing:
- The device has 15 address lines (A0-A14) which are used to select one of the 32,768 memory locations.
- Address lines should be driven by a stable and noise-free source.
Data I/O:
- The data lines (D0-D7) are used to read data from the selected memory location.
- Data lines are tri-stated when the output enable (OE#) pin is high.
Control Signals:
- Chip Enable (CE#): When low, the device is active and can be accessed. When high, the device is in a high-impedance state.
- Output Enable (OE#): When low, the data lines are enabled and the data from the selected memory location is output. When high, the data lines are tri-stated.
Timing:
- Ensure that the access time (tAA) is respected to avoid data corruption. The device has a typical access time of 90ns at 5V and 25°C.
- Proper timing must be maintained for all control signals to ensure reliable operation.
Handling:
- Handle the device with care to avoid static discharge and physical damage.
- Store the device in a dry and cool environment to prevent degradation.
Testing:
- Before integrating the device into a system, perform basic functionality tests to ensure it meets the specified parameters.
- Use a logic analyzer or similar tool to verify the correct operation of the device.
Environmental Considerations:
- Operate the device within the specified temperature ranges to ensure reliable performance and longevity.
- Avoid exposing the device to extreme temperatures or humidity during storage and operation.
By following these instructions, you can ensure the optimal performance and reliability of the M27C256B-90B1 device.
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