Details
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| Parameter | Symbol | Min | Typ | Max | Unit |
|---|---|---|---|---|---|
| Drain-Source Voltage | V(DS) | - | - | 450 | V |
| Gate-Source Voltage | V(GS) | -20 | - | 20 | V |
| Drain Current | I(D) | - | - | 10 | A |
| Gate Threshold Voltage | V(GS(th)) | 2.0 | 3.0 | 4.0 | V |
| Input Capacitance | Ciss | - | 1600 | - | pF |
| Output Capacitance | Coss | - | 190 | - | pF |
| Reverse Transfer Capacitance | Crss | - | 150 | - | pF |
| Power Dissipation | P(TOT) | - | - | 280 | W |
| Junction Temperature | Tj | -55 | - | 175 | 掳C |
| Storage Temperature | Tstg | -55 | - | 150 | 掳C |
Instructions for Use:
Handling Precautions:
- Avoid exposing the device to temperatures outside the specified range.
- Handle the device with care to prevent mechanical damage.
- Use proper ESD (Electrostatic Discharge) protection when handling the device.
Mounting and Soldering:
- Ensure that the mounting surface is clean and free from contaminants.
- Use a soldering iron with a temperature setting appropriate for the device (typically around 260掳C).
- Avoid excessive soldering time to prevent thermal damage to the device.
Biasing and Operation:
- Ensure that the gate-source voltage (V(GS)) is within the specified limits to avoid damaging the gate oxide.
- Operate the device within the drain current (I(D)) and power dissipation (P(TOT)) limits to prevent overheating and potential failure.
- Monitor the junction temperature (Tj) to ensure it does not exceed the maximum rating.
Testing and Verification:
- Perform initial testing at low power levels to verify correct operation.
- Use appropriate test equipment to measure key parameters such as V(GS), I(D), and V(DS).
- Verify that the device meets the specified performance criteria under all operating conditions.
Storage:
- Store the device in a dry, cool environment to prevent moisture absorption and degradation.
- Keep the device in its original packaging until ready for use to protect against static discharge and physical damage.
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