Details
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| Parameter | Symbol | Min | Typical | Max | Unit | Conditions |
|---|---|---|---|---|---|---|
| Drain-Source Voltage | VDS | - | - | 60 | V | Continuous |
| Gate-Source Voltage | VGS | -20 | - | 20 | V | Continuous |
| Continuous Drain Current | ID | - | 32 | - | A | TC = 25掳C |
| - | 24 | - | A | TC = 100掳C | ||
| Pulse Drain Current | IDpeak | - | 96 | - | A | tp = 10 渭s, IG = 0 A, TC = 25掳C |
| Power Dissipation | PTOT | - | - | 110 | W | TC = 25掳C |
| Junction Temperature | TJ | - | - | 175 | 掳C | Maximum Operating |
| Storage Temperature | TSTG | -55 | - | 150 | 掳C | - |
| Thermal Resistance | R胃JC | - | 0.58 | - | 掳C/W | Junction to Case |
Instructions for Use:
Handling Precautions:
- Avoid exposing the device to high temperatures or excessive mechanical stress.
- Use proper ESD (Electrostatic Discharge) protection when handling the device.
Mounting:
- Ensure good thermal management by using a heatsink if necessary.
- Apply thermal compound between the device and heatsink for better heat dissipation.
Biasing:
- The gate-source voltage (VGS) should be kept within the specified limits to avoid damage.
- For optimal performance, ensure that the gate is driven with a clean, fast edge to minimize switching losses.
Current Limitation:
- Do not exceed the continuous drain current ratings at the specified case temperatures.
- For pulse applications, ensure that the pulse duration and frequency do not exceed the safe operating area (SOA).
Storage:
- Store the device in a dry, cool environment within the specified storage temperature range.
- Avoid exposure to corrosive environments.
Testing:
- When testing the device, use appropriate test equipment and follow safety guidelines to prevent damage or injury.
Application Notes:
- Refer to the datasheet for detailed application notes and circuit diagrams to ensure correct usage in your specific application.
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