DS34LV86TMX/NOPB

DS34LV86TMX/NOPB


Specifications
SKU
12599470
Details

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Parameter Symbol Min Typ Max Unit
Supply Voltage VCC 2.5 - 5.5 V
Operating Temperature TOP -40 - 85 掳C
Storage Temperature TSTG -65 - 150 掳C
Input Voltage Range VI 0 - VCC V
Output Voltage Range VO 0 - VCC V
Maximum Output Current IO - 20 - mA
Quiescent Current IQ 0.1 0.5 1.0 渭A
Propagation Delay Time (High to Low) tPLH 10 20 30 ns
Propagation Delay Time (Low to High) tPHL 10 20 30 ns
Input Capacitance CI - 5 - pF
Output Capacitance CO - 10 - pF
Maximum Power Dissipation PD - - 350 mW

Instructions for DS34LV86TMX/NOPB

  1. Power Supply:

    • Ensure the supply voltage (VCC) is within the range of 2.5V to 5.5V.
    • Use a stable power source to avoid fluctuations that could affect performance.
  2. Temperature Considerations:

    • The operating temperature range is from -40掳C to 85掳C.
    • Store the device in an environment with temperatures between -65掳C and 150掳C.
  3. Input and Output Voltage:

    • The input voltage (VI) should be within the range of 0V to VCC.
    • The output voltage (VO) will also be within the range of 0V to VCC.
  4. Current Handling:

    • The maximum output current (IO) is 20mA. Do not exceed this limit to prevent damage.
    • The quiescent current (IQ) is typically 0.5渭A, but can range from 0.1渭A to 1.0渭A.
  5. Propagation Delay:

    • The propagation delay times (tPLH and tPHL) are typically 20ns, with a minimum of 10ns and a maximum of 30ns.
  6. Capacitance:

    • The input capacitance (CI) is typically 5pF.
    • The output capacitance (CO) is typically 10pF.
  7. Power Dissipation:

    • The maximum power dissipation (PD) is 350mW. Ensure proper heat dissipation to avoid overheating.
  8. Handling and Storage:

    • Handle the device with care to avoid static discharge, which can damage the component.
    • Store the device in a dry, cool place to prevent moisture damage.
  9. Mounting:

    • Follow the recommended soldering profile to ensure reliable connections.
    • Avoid excessive thermal stress during soldering.
  10. Testing:

    • Test the device under controlled conditions to verify its performance before integrating it into a larger system.
(For reference only)

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