Details
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| Parameter | Symbol | Min | Typical | Max | Unit | Notes |
|---|---|---|---|---|---|---|
| Drain-Source Voltage | VDS | - | - | 900 | V | |
| Gate-Source Voltage | VGS | -15 | - | 20 | V | |
| Continuous Drain Current | ID | - | 3.0 | - | A | TC = 25掳C |
| Pulse Drain Current | ID(p) | - | 8.0 | - | A | tp = 10 渭s, IG = 10 A |
| Power Dissipation | PD | - | - | 140 | W | TC = 25掳C |
| Junction Temperature | TJ | -55 | - | 175 | 掳C | |
| Storage Temperature | TSTG | -55 | - | 175 | 掳C | |
| Total Device Weight | - | - | - | 3.5 | g |
Instructions for Use:
Mounting:
- Ensure proper heat sinking to maintain the junction temperature within specified limits.
- Use a thermal interface material (TIM) between the device and the heatsink for optimal thermal performance.
Biasing:
- Apply gate-source voltage (VGS) within the range of -15V to +20V to ensure reliable operation.
- Avoid exceeding the maximum gate-source voltage to prevent damage to the device.
Current Handling:
- Do not exceed the continuous drain current (ID) of 3.0A at 25掳C case temperature.
- For pulse applications, do not exceed 8.0A for a pulse duration of 10 渭s with a gate current of 10A.
Thermal Management:
- Monitor the junction temperature (TJ) to ensure it does not exceed 175掳C.
- Store the device in an environment where the temperature ranges from -55掳C to 175掳C.
Handling:
- Handle the device with care to avoid mechanical stress or damage.
- Use appropriate ESD protection when handling to prevent electrostatic discharge damage.
Testing:
- Test the device under controlled conditions to ensure it meets the specified parameters.
- Refer to the datasheet for detailed testing procedures and recommended test circuits.
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