Details
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| Parameter | Description |
|---|---|
| Device Type | Dual 4-input NAND Gate |
| Package Type | DIP, SOIC |
| Supply Voltage (VDD) | 3V to 15V |
| Input Voltage (VIH) | Min: 70% VDD, Max: VDD |
| Output Voltage (VOH) | Min: 90% VDD, Max: VDD |
| Propagation Delay Time (tpd) | Max: 28ns @ VDD=10V, Max: 65ns @ VDD=5V |
| Power Dissipation (PD) | Max: 100mW per package |
| Operating Temperature Range | -40掳C to +85掳C |
| Storage Temperature Range | -65掳C to +150掳C |
Instructions for Use:
- Power Supply Connection: Connect the positive supply voltage (VDD) to pin 14 and ground (GND) to pin 7.
- Input Connections: Connect input signals to pins 1, 2, 3, 4 for the first gate and pins 5, 6, 12, 13 for the second gate.
- Output Connections: Outputs are available on pins 8 for the first gate and pin 9 for the second gate.
- Handling Precautions: This device is sensitive to electrostatic discharge (ESD). Handle with care and use proper ESD protection measures.
- Decoupling Capacitors: Place a decoupling capacitor close to the power supply pins to reduce noise and improve stability.
- Signal Levels: Ensure that all input signals comply with the specified VIH and VIL levels to avoid undefined behavior.
- Unused Inputs: If not all inputs are used, tie unused inputs to VDD or GND as appropriate to prevent floating conditions which can cause unpredictable operation.
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