AM26C31IPWR

AM26C31IPWR


Specifications
SKU
12600325
Details

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Parameter Symbol Min Typical Max Unit Conditions
Supply Voltage VCC 4.75 5.0 5.25 V -
Input Voltage (High) VIH 3.15 - 5.25 V -
Input Voltage (Low) VIL 0 - 2.1 V -
Output Voltage (High) VOH 2.4 - 5.25 V IOL = 0.4 mA
Output Voltage (Low) VOL 0 - 0.5 V IOL = 16 mA
Propagation Delay Time tpd - 18 36 ns VCC = 5V, TA = 25掳C
Skew tskew - 5 10 ns VCC = 5V, TA = 25掳C
Operating Temperature TA -40 - 85 掳C -
Storage Temperature TSTG -65 - 150 掳C -
Maximum Junction Temperature TJ(max) - - 150 掳C -

Instructions for Use:

  1. Power Supply:

    • Ensure the supply voltage (VCC) is within the specified range of 4.75V to 5.25V.
    • Connect the ground (GND) pin to a stable reference point.
  2. Input Signals:

    • For a valid high input (VIH), the voltage should be between 3.15V and 5.25V.
    • For a valid low input (VIL), the voltage should be between 0V and 2.1V.
  3. Output Signals:

    • The output voltage (VOH) will be between 2.4V and 5.25V when the output is high.
    • The output voltage (VOL) will be between 0V and 0.5V when the output is low.
  4. Propagation Delay:

    • The propagation delay time (tpd) is typically 18ns with a maximum of 36ns at VCC = 5V and ambient temperature (TA) = 25掳C.
  5. Skew:

    • The skew (tskew) is typically 5ns with a maximum of 10ns under the same conditions as propagation delay.
  6. Temperature Considerations:

    • The device can operate over a temperature range from -40掳C to 85掳C.
    • Store the device in an environment where the temperature does not exceed -65掳C to 150掳C.
    • Do not exceed the maximum junction temperature (TJ(max)) of 150掳C during operation.
  7. Handling:

    • Handle the device with care to avoid damage from electrostatic discharge (ESD).
    • Follow proper soldering techniques to ensure reliable connections.
  8. Mounting:

    • Ensure proper mounting on the PCB to maintain thermal performance and mechanical stability.
    • Use appropriate cooling solutions if operating in high-temperature environments or under high power conditions.
  9. Testing:

    • Verify the functionality of the device using a test setup that mimics the intended application conditions.
    • Check for correct voltage levels and signal integrity during testing.
(For reference only)

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