Details
BUY 2N5447 https://www.utsource.net/itm/p/12603682.html
| Parameter | Symbol | Min | Typ | Max | Unit |
|---|---|---|---|---|---|
| Collector-Emitter Voltage | VCEO | - | - | 100 | V |
| Collector-Base Voltage | VCBO | - | - | 150 | V |
| Emitter-Base Voltage | VEBO | - | - | 5 | V |
| Collector Current | IC | - | - | 200 | mA |
| Base Current | IB | - | - | 5 | mA |
| Power Dissipation | PT | - | - | 350 | mW |
| Forward Current Transfer Ratio | hFE | 100 | 300 | - | - |
| Storage Temperature Range | TSTG | -65 | - | 150 | 掳C |
| Operating Junction Temperature | TJ | -65 | - | 150 | 掳C |
Instructions for Use:
Handling:
- Avoid excessive mechanical stress during handling.
- Use proper ESD (Electrostatic Discharge) protection when handling the device.
Mounting:
- Ensure good thermal contact with the mounting surface to prevent overheating.
- Use a heat sink if continuous high power dissipation is expected.
Biasing:
- Ensure that the base current (IB) is sufficient to fully saturate the transistor for switching applications.
- For linear applications, operate within the active region by biasing the base-emitter junction properly.
Voltage and Current Ratings:
- Do not exceed the maximum ratings for collector-emitter voltage (VCEO), collector-base voltage (VCBO), and emitter-base voltage (VEBO).
- Limit the collector current (IC) and base current (IB) to their respective maximum values.
Temperature:
- Operate within the specified storage and operating temperature ranges to avoid damage.
- Monitor the junction temperature (TJ) to ensure it does not exceed the maximum limit.
Testing:
- Use appropriate test equipment and procedures to verify the performance of the transistor.
- Follow standard testing guidelines to avoid damaging the device.
Storage:
- Store the device in a dry, cool place away from direct sunlight and sources of heat.
- Keep the device in its original packaging until ready for use to protect against static discharge.
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