Details
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| Parameter | Symbol | Min | Typ | Max | Unit | Description |
|---|---|---|---|---|---|---|
| Supply Voltage | VCC | 4.5 | 5.0 | 5.5 | V | Operating supply voltage |
| Quiescent Current | IQ | - | 1.0 | - | mA | Current consumption in standby mode |
| Output Current (High) | IOH | - | 30 | - | mA | Maximum output current when high |
| Output Current (Low) | IOL | - | 30 | - | mA | Maximum output current when low |
| Input Voltage Range | VI | 0 | 5.5 | - | V | Valid input voltage range |
| Maximum Junction Temperature | TJ(max) | - | - | 150 | 掳C | Maximum junction temperature |
| Storage Temperature Range | TSTG | -40 | - | 150 | 掳C | Temperature range for storage |
| Operating Temperature Range | TA | -40 | - | 125 | 掳C | Ambient operating temperature range |
Instructions for TLE6228GP
Supply Voltage:
- Ensure the supply voltage is within the specified range of 4.5V to 5.5V to avoid damage to the device.
Quiescent Current:
- The quiescent current is typically 1.0 mA. This value should be considered when designing the power supply to ensure efficient power usage.
Output Current:
- The maximum output current for both high and low states is 30 mA. Do not exceed this limit to prevent damage to the output pins.
Input Voltage Range:
- The valid input voltage range is from 0V to 5.5V. Inputs outside this range may cause undefined behavior or damage.
Temperature Considerations:
- The maximum junction temperature is 150掳C. Ensure proper heat dissipation and cooling mechanisms are in place.
- The storage temperature range is -40掳C to 150掳C. Store the device in a suitable environment to avoid degradation.
- The operating temperature range is -40掳C to 125掳C. Operate the device within this range to ensure reliable performance.
Handling:
- Handle the device with care to avoid static discharge. Use appropriate ESD protection measures during handling and installation.
Mounting:
- Follow recommended PCB layout guidelines to ensure optimal thermal performance and signal integrity.
Testing:
- Perform initial testing under controlled conditions to verify the functionality of the device before integrating it into the final application.
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