Details
BUY MMD60R580Q https://www.utsource.net/itm/p/12606345.html
| Parameter | Symbol | Value | Unit | Notes |
|---|---|---|---|---|
| Maximum Drain-Source Voltage | VDS(max) | 600 | V | - |
| Maximum Gate-Source Voltage | VGS(max) | 卤20 | V | - |
| Maximum Continuous Drain Current | ID(max) | 580 | A | at TC = 25掳C |
| Maximum Pulse Drain Current | IDM(max) | 1160 | A | tp = 10 渭s, IAS = 0.33 IDM |
| Maximum Power Dissipation | PTOT(max) | 2400 | W | at TC = 25掳C |
| Junction to Case Thermal Resistance | R胃JC | 0.012 | 掳C/W | - |
| Junction to Ambient Thermal Resistance | R胃JA | 0.25 | 掳C/W | - |
| Storage Temperature Range | Tstg | -55 to +150 | 掳C | - |
| Operating Junction Temperature Range | TJ(op) | -55 to +175 | 掳C | - |
Instructions for Use:
Voltage Handling:
- Ensure that the drain-source voltage (VDS) does not exceed 600V.
- The gate-source voltage (VGS) should be kept within 卤20V to avoid damage.
Current Management:
- The continuous drain current (ID) should not exceed 580A at a case temperature (TC) of 25掳C.
- For pulse operations, the maximum pulse drain current (IDM) is 1160A with a pulse duration (tp) of 10 渭s and a current sharing factor (IAS) of 0.33 IDM.
Power Dissipation:
- The total power dissipation (PTOT) should not exceed 2400W at a case temperature (TC) of 25掳C.
Thermal Management:
- Ensure proper heat sinking to manage the junction-to-case thermal resistance (R胃JC) of 0.012掳C/W and the junction-to-ambient thermal resistance (R胃JA) of 0.25掳C/W.
Temperature Ranges:
- Store the device within the storage temperature range of -55掳C to +150掳C.
- Operate the device within the operating junction temperature range of -55掳C to +175掳C.
Handling and Installation:
- Handle the device with care to avoid mechanical stress and electrostatic discharge (ESD).
- Follow recommended soldering profiles and ensure proper mounting to prevent thermal and mechanical issues.
Testing and Verification:
- Verify all parameters and conditions during testing to ensure the device operates within specified limits.
- Regularly inspect the device for signs of wear or damage, especially in high-stress applications.
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