Details
BUY 28NM50N https://www.utsource.net/itm/p/12606347.html
| Parameter | Symbol | Min | Typ | Max | Unit | Notes |
|---|---|---|---|---|---|---|
| Drain-Source Voltage | VDS | - | 50 | - | V | |
| Gate-Source Voltage | VGS | -10 | - | 10 | V | |
| Continuous Drain Current | ID | - | 50 | - | A | @ TC = 25掳C |
| Pulse Drain Current | ID(p) | - | 100 | - | A | tp = 10 渭s, Duty Cycle = 1% |
| Power Dissipation | PTOT | - | 100 | - | W | @ TC = 25掳C |
| Junction Temperature | TJ | - | - | 175 | 掳C | |
| Storage Temperature Range | TSTG | -65 | - | 150 | 掳C |
Instructions for Use:
Handling Precautions:
- The 28NM50N is sensitive to electrostatic discharge (ESD). Handle with care and use appropriate ESD protection.
- Avoid exposing the device to temperatures outside the specified storage temperature range.
Mounting:
- Ensure proper heat sinking to manage power dissipation, especially when operating at high current levels.
- Use recommended PCB layout guidelines to minimize parasitic inductance and ensure stable operation.
Biasing:
- Apply gate-source voltage (VGS) within the specified limits to avoid damage to the gate oxide.
- For optimal performance, keep VGS between 4V and 10V for full enhancement.
Operation:
- Do not exceed the maximum drain-source voltage (VDS) to prevent breakdown.
- Monitor the junction temperature (TJ) to ensure it stays below 175掳C to avoid thermal runaway.
Testing:
- When testing, use pulsed conditions to avoid exceeding the maximum power dissipation.
- For continuous operation, ensure that the device is adequately cooled to maintain TJ within safe limits.
Storage:
- Store the device in a dry, cool place to prevent moisture absorption and degradation.
- Follow recommended packaging and handling procedures to maintain device integrity.
For detailed application notes and further information, refer to the datasheet provided by the manufacturer.
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