PQ050DNA1

PQ050DNA1


Specifications
SKU
12606490
Details

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Parameter Description Value
Part Number PQ050DNA1
Type N-Channel MOSFET
Package TO-220AB
VDSS Drain-to-Source Voltage 50V
ID Continuous Drain Current (TC = 25掳C) 34A
ID Continuous Drain Current (TC = 75掳C) 28A
RDS(on) On-State Resistance (VGS = 10V, ID = 11A) 1.9m惟
VGS(th) Gate Threshold Voltage 2.0V to 4.0V
QG Total Gate Charge 58nC
QGD Gate-to-Drain Charge 16nC
fT Transition Frequency 1.2MHz
Eoss Output Capacitance Energy Loss 12nJ
PD Maximum Power Dissipation (TA = 25掳C) 100W
TJ Junction Temperature Range -55掳C to 150掳C
TSTG Storage Temperature Range -55掳C to 150掳C

Instructions for Use:

  1. Handling Precautions:

    • ESD Protection: Handle the PQ050DNA1 with care to avoid damage from electrostatic discharge (ESD). Use proper ESD protection equipment such as wrist straps and grounded work surfaces.
    • Soldering: Ensure that the soldering temperature does not exceed 260掳C and that the soldering time is kept to a minimum to prevent thermal damage.
  2. Mounting:

    • Thermal Management: The PQ050DNA1 can dissipate up to 100W of power at ambient temperatures of 25掳C. For higher power applications, use a heatsink to ensure the junction temperature remains within the specified range.
    • Mechanical Stress: Avoid applying excessive mechanical stress to the leads during installation. Ensure that the leads are properly supported and aligned before soldering.
  3. Electrical Considerations:

    • Gate Drive: The gate threshold voltage (VGS(th)) ranges from 2.0V to 4.0V. Ensure that the gate drive circuit provides sufficient voltage to fully turn on the MOSFET.
    • Overvoltage Protection: Do not exceed the maximum drain-to-source voltage (VDSS) of 50V to prevent breakdown and potential damage to the device.
    • Current Limiting: Monitor the continuous drain current (ID) to ensure it does not exceed the rated values, especially under high-temperature conditions.
  4. Storage:

    • Environmental Conditions: Store the PQ050DNA1 in a dry, cool place away from direct sunlight and sources of heat. The storage temperature range is -55掳C to 150掳C.
    • Humidity Control: To prevent moisture absorption, store the device in a low-humidity environment or use desiccant packets if long-term storage is required.
  5. Testing:

    • Initial Testing: Before integrating the PQ050DNA1 into a circuit, perform initial testing to verify its functionality. Check the gate-to-source and drain-to-source voltages, and ensure the on-state resistance (RDS(on)) is within the specified range.
    • Functional Testing: After installation, perform functional testing to ensure the device operates correctly under expected operating conditions.

For more detailed information, refer to the datasheet provided by the manufacturer.

(For reference only)

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