FQD1N80

FQD1N80


Specifications
Details

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Parameter Symbol Conditions Min Typ Max Unit
Drain-Source Voltage V(DS) 800 V
Gate-Source Voltage V(GS) -15 15 V
Continuous Drain Current I(D) Tc = 25掳C 8 A
Pulse Drain Current I(D pul) Tc = 25掳C, tp = 10ms 32 A
Gate Charge Q(G) V(GS) = 10V 46 nC
Input Capacitance Ciss V(DS) = 0V, f = 1MHz 1700 pF
Output Capacitance Coss V(DS) = 400V, f = 1MHz 420 pF
Reverse Transfer Capacitance Crss V(DS) = 400V, V(GS) = 0V, f = 1MHz 1280 pF
RDS(on) R(DS(on)) V(GS) = 10V, Id = 2.5A 1.9

Instructions for Use:

  1. Handling Precautions: The FQD1N80 is sensitive to electrostatic discharge (ESD). Handle with care and use proper ESD protection measures.
  2. Mounting: Ensure the device is securely mounted on a heatsink if operating near maximum current ratings to prevent overheating.
  3. Voltage Ratings: Do not exceed the maximum drain-source voltage (V(DS)) of 800V or gate-source voltage (V(GS)) of 卤15V.
  4. Current Ratings: Continuous operation should not exceed the continuous drain current (I(D)) rating of 8A at case temperature (Tc) of 25掳C.
  5. Gate Drive: For optimal performance, drive the gate with a voltage between 10V and 15V. Ensure the gate driver can supply sufficient current to charge/discharge the gate capacitance quickly.
  6. Pulse Operation: For pulse applications, ensure the pulse duration does not exceed 10ms and the peak current does not exceed 32A.
  7. Capacitance Considerations: Account for input (Ciss), output (Coss), and reverse transfer (Crss) capacitances in circuit design, especially in high-frequency applications.
  8. Thermal Management: Monitor the junction temperature to ensure it remains within safe limits. Use appropriate cooling methods as necessary.
(For reference only)

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