Details

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BUY M27C1001-12C6 https://www.utsource.net/itm/p/12606887.html

Parameter	Description	Value
Device Type	Non-Volatile Memory	1 Mbit (128K x 8) UV-Erasable PROM
Package	Plastic Dual In-Line Package (PDIP)	28-Pin
Operating Voltage (Vcc)	Supply Voltage Range	4.5V to 5.5V
Standby Current (Typical)	Power Consumption in Standby Mode	10 渭A
Active Current (Typical)	Power Consumption in Active Mode	25 mA
Access Time (Typical)	Time from Address Valid to Data Valid	120 ns
Data Retention	Guaranteed Data Retention Time	10 years
Programming Voltage (Vpp)	Voltage for Programming	12.5V to 13.0V
Erase Time	Time Required for Full Chip Erase	30 minutes (UV Exposure)
Operating Temperature Range	Temperature Range for Normal Operation	-40掳C to +85掳C
Storage Temperature Range	Temperature Range for Storage	-65掳C to +150掳C
Endurance	Number of Program/Erase Cycles	1,000 cycles

Instructions for Use

1. Power Supply:

   • Ensure that the Vcc supply voltage is within the specified range of 4.5V to 5.5V.
   • Connect the Vss pin to ground.

2. Programming:

   • Apply the programming voltage (Vpp) of 12.5V to 13.0V to the appropriate pin.
   • Set the address lines to the desired memory location.
   • Set the data lines to the data you want to program.
   • Apply a write pulse to the write enable (WE) pin.
   • Verify the programmed data by reading back the memory location.

3. Erasing:

   • Expose the device to UV light for at least 30 minutes to erase the entire chip.
   • Ensure the UV light source has a wavelength of approximately 253.7 nm.

4. Reading:

   • Set the address lines to the desired memory location.
   • The data will be available on the data lines after the access time (typically 120 ns).

5. Handling:

   • Handle the device with care to avoid static discharge, which can damage the device.
   • Store the device in a dry environment to prevent moisture damage.

6. Mounting:

   • Ensure proper alignment of the device during mounting to avoid mechanical stress on the pins.
   • Follow recommended soldering profiles to avoid thermal damage.

7. Testing:

   • Perform functional testing after programming and erasing to ensure the device operates correctly.
   • Use a memory tester or equivalent equipment to verify the integrity of the programmed data.

(For reference only)