Details
BUY S29AL008D70TFI01 https://www.utsource.net/itm/p/12607014.html
| Parameter | Description | Value | Unit |
|---|---|---|---|
| Device Type | Non-volatile Flash Memory | - | - |
| Density | Memory Size | 8 Mbit | - |
| Organization | Data Organization | 512K x 16 | - |
| VCC Operating Range | Supply Voltage | 2.7 to 3.6 | V |
| VPP Programming Voltage | Programming Voltage | Not Required | - |
| Access Time | Read Access Time (tR) | 70 | ns |
| Write Cycle Time | Program/Erase Cycle Time | 5 ms | - |
| Endurance | Program/Erase Cycles | 100,000 | - |
| Data Retention | Data Retention Time | 10 years | - |
| Operating Temperature Range | Industrial Temperature Range | -40 to +85 | 掳C |
| Package Type | Package | TSOP-48 | - |
| Pin Count | Number of Pins | 48 | - |
| Mounting Type | Surface Mount | - | - |
Instructions for Use:
Power Supply:
- Connect the VCC pin to a power supply within the range of 2.7V to 3.6V.
- Ensure a stable power supply to avoid data corruption.
Programming:
- The device does not require a separate programming voltage (VPP).
- Use the standard command set for flash memory programming and erasing.
- Program and erase operations should be performed according to the specified cycle time of 5 ms to ensure data integrity.
Access Time:
- The read access time is 70 ns. Ensure that your system timing is compatible with this value to avoid read errors.
Temperature:
- Operate the device within the industrial temperature range of -40掳C to +85掳C to ensure reliable performance.
Endurance:
- The device can withstand up to 100,000 program/erase cycles. Monitor usage to avoid exceeding this limit.
Data Retention:
- Data retention is guaranteed for up to 10 years under normal operating conditions.
Mounting:
- The device is available in a TSOP-48 package. Follow standard surface mount technology (SMT) procedures for mounting and soldering.
Handling:
- Handle the device with care to avoid static discharge, which can damage the memory cells.
- Store the device in a dry environment to prevent moisture damage.
Pin Configuration:
- Refer to the datasheet for detailed pin configuration and signal descriptions.
Testing:
- Perform initial testing to verify proper operation before integrating the device into your system.
- Use appropriate test vectors to validate read, write, and erase functions.
For more detailed information, refer to the full datasheet provided by the manufacturer.
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