Details
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| Parameter | Symbol | Min | Typical | Max | Unit |
|---|---|---|---|---|---|
| Drain-Source Voltage | VDS | - | 200 | - | V |
| Gate-Source Voltage | VGS | -15 | - | 20 | V |
| Continuous Drain Current | ID | - | 7 | - | A |
| Pulse Drain Current | IDpeak | - | 35 | - | A |
| Power Dissipation | PTOT | - | 110 | - | W |
| Junction Temperature | TJ | -55 | - | 175 | 掳C |
| Storage Temperature | TSTG | -55 | - | 150 | 掳C |
| Thermal Resistance, Junction to Case | RthJC | - | 0.58 | - | 掳C/W |
| Total Gate Charge | QG | - | 69 | - | nC |
| Input Capacitance | Ciss | - | 1750 | - | pF |
| Output Capacitance | Coss | - | 380 | - | pF |
| Reverse Transfer Capacitance | Crss | - | 220 | - | pF |
Instructions for Use:
Mounting and Handling:
- Ensure proper heat sinking to manage the power dissipation.
- Handle with care to avoid damage to the leads and the semiconductor junction.
Biasing:
- Apply a gate-source voltage (VGS) within the specified range to control the drain current (ID).
- Avoid exceeding the maximum gate-source voltage to prevent gate damage.
Operating Conditions:
- Do not exceed the maximum drain-source voltage (VDS) to prevent breakdown.
- Ensure the continuous drain current (ID) does not exceed the rated value to avoid overheating.
- For pulse applications, ensure the peak drain current (IDpeak) is within limits to prevent thermal stress.
Thermal Management:
- Monitor the junction temperature (TJ) to ensure it stays within the safe operating range.
- Use appropriate cooling methods such as heatsinks or forced air cooling to maintain optimal temperature.
Storage:
- Store the device in a dry, cool environment within the specified storage temperature range (TSTG).
Electrostatic Discharge (ESD) Protection:
- Handle the device with ESD protection measures to prevent damage from static electricity.
Testing:
- Use appropriate test equipment and procedures to verify the device parameters and functionality without exceeding the maximum ratings.
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