Details
BUY IRFI4212H-1 https://www.utsource.net/itm/p/12607203.html
| Parameter | Symbol | Min | Typ | Max | Unit | Conditions |
|---|---|---|---|---|---|---|
| Drain-Source On-State Resistance | RDS(on) | - | 24 | - | m惟 | VGS = 10V, ID = 5A |
| Gate-Source Threshold Voltage | VGS(th) | 2.0 | - | 4.0 | V | ID = 250渭A |
| Continuous Drain Current | ID | - | - | 30 | A | TC = 25掳C |
| Pulse Drain Current | ID(pulse) | - | - | 60 | A | t = 10ms, TC = 25掳C |
| Total Dissipation | PD | - | - | 75 | W | TC = 25掳C |
| Junction Temperature | TJ | -20 | - | 150 | 掳C | |
| Storage Temperature | TSTG | -55 | - | 150 | 掳C |
Instructions for IRFI4212H-1
Mounting and Handling:
- Ensure the device is handled carefully to avoid damage to the leads.
- Use appropriate anti-static precautions during handling.
Thermal Considerations:
- Ensure adequate heat sinking if operating near maximum power dissipation.
- Monitor junction temperature to prevent overheating.
Biasing and Drive:
- Apply gate voltage within specified limits to avoid damaging the gate oxide.
- Use a gate resistor to limit current and dampen oscillations.
Operation:
- Do not exceed maximum ratings for drain-source voltage, continuous drain current, or pulse drain current.
- Ensure that the device operates within its safe operating area (SOA).
Storage:
- Store in a dry environment within the specified storage temperature range.
- Avoid exposure to corrosive environments.
Testing:
- Test parameters under controlled conditions to ensure accurate measurement.
- Refer to datasheet for detailed test circuits and procedures.
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