74HC646AP

74HC646AP


Specifications
SKU
12607445
Details

BUY 74HC646AP https://www.utsource.net/itm/p/12607445.html

Parameter Symbol Min Typ Max Unit Conditions
Supply Voltage VCC 2.0 - 6.0 V
Input Low Voltage VIL - - 1.5 V VCC = 4.5 to 5.5V
Input High Voltage VIH 3.5 - - V VCC = 4.5 to 5.5V
Output Low Voltage (Sink) VOL 0.0 0.1 0.2 V IOL = 4 mA
Output High Voltage (Source) VOH 4.8 4.9 5.0 V IOH = -4 mA, VCC = 5V
Input Leakage Current IIL -1 - 1 渭A VCC = 4.5 to 5.5V
Output Leakage Current IOL -1 - 1 渭A VCC = 4.5 to 5.5V
Propagation Delay Time tpd - 10 30 ns VCC = 4.5 to 5.5V, TA = 25掳C
Power Dissipation PD - - 100 mW Per Package
Operating Temperature Range TA -40 - 85 掳C
Storage Temperature Range TSTG -65 - 150 掳C

Instructions for Use:

  1. Supply Voltage:

    • Ensure the supply voltage (VCC) is within the range of 2.0V to 6.0V. The typical operating voltage is 5V.
  2. Input Levels:

    • For proper operation, input low voltage (VIL) should be less than or equal to 1.5V, and input high voltage (VIH) should be greater than or equal to 3.5V when VCC is between 4.5V and 5.5V.
  3. Output Levels:

    • When sinking current (IOL = 4 mA), the output low voltage (VOL) should be between 0.0V and 0.2V.
    • When sourcing current (IOH = -4 mA), the output high voltage (VOH) should be between 4.8V and 5.0V at VCC = 5V.
  4. Leakage Current:

    • Input leakage current (IIL) and output leakage current (IOL) should not exceed 卤1 渭A.
  5. Propagation Delay:

    • The propagation delay time (tpd) is typically 10 ns with a maximum of 30 ns at room temperature (25掳C).
  6. Power Dissipation:

    • The maximum power dissipation per package is 100 mW.
  7. Temperature Ranges:

    • The operating temperature range (TA) is from -40掳C to 85掳C.
    • The storage temperature range (TSTG) is from -65掳C to 150掳C.
  8. Handling:

    • Handle the device with care to avoid damage from electrostatic discharge (ESD). Use proper ESD protection measures.
  9. Mounting:

    • Ensure proper mounting and soldering techniques to avoid thermal and mechanical stress on the device.
  10. Testing:

    • Before final assembly, test the device under the specified conditions to ensure it meets the required performance parameters.
(For reference only)

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